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100   $a20160829d1996      uy 
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$a1996 IEEE Hong Kong Electron Devices Meeting : proceedings, 29 June 1996, the Hong Kong Polytechnic University
210 31$a[Place of publication not identified]$cInstitute of Electrical and Electronics Engineers$d1996
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780780330917 
311 08$a0780330919 
606   $aSemiconductors$vCongresses
606   $aSilicon-on-insulator technology$vCongresses
606   $aTransistors$xCongresses
606   $aDetectors$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aElectrical Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aSemiconductors
615  0$aSilicon-on-insulator technology
615  0$aTransistors$xCongresses.
615  0$aDetectors
615  7$aElectrical & Computer Engineering
615  7$aElectrical Engineering
615  7$aEngineering & Applied Sciences
676   $a621.3815/2
712 02$aIEEE Electron Devices Society
712 02$aHong Kong Polytechnic University
712 02$aHong Kong Polytechnic University Department of Electronic Engineering.
712 12$aIEEE Hong Kong Electron Devices Meeting
801  0$bPQKB
906   $aBOOK
912   $a9910872778603321
996   $a1996 IEEE Hong Kong Electron Devices Meeting : proceedings, 29 June 1996, the Hong Kong Polytechnic University$92546276
997   $aUNINA