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101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$aDesigning, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
210 31$a[Place of publication not identified]$cThe Conference$d1993
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780780314306 
311 08$a0780314301 
606   $aIntegrated circuits$xTesting$vCongresses
606   $aAutomatic test equipment$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIntegrated circuits$xTesting
615  0$aAutomatic test equipment
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.3815/028/7
712 02$aIEEE Computer Society Test Technology Technical Committee
712 02$aInstitute of Electrical and Electronics Engineers Philadelphia Section.
712 12$aInternational Test Conference
801  0$bPQKB
906   $aBOOK
912   $a9910872775803321
996   $aDesigning, testing, and diagnostics--join them : International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA$92546901
997   $aUNINA