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200 10$a2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d2000
215   $a1 online resource (438 pages)
300   $aBibliographic Level Mode of Issuance: Monograph
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311 08$a0769507190 
330   $aThis volume includes 45 papers presented at the October 2000 symposium, covering yield analysis, modeling, and enhancement; fault tolerance interconnections and systems; reconfiguration and repair; error coding; online testing; testing and BIST techniques; and fault injection techniques and environments. The authors, professionals and academics from 18 different companies, offer papers on specific topics such as quality-effective repair of multichip module systems, evaluations of burst error recovery for VF arithmetic coding, and test cost minimization for Hybrid BIST. A thorough subject index is lacking. Annotation copyrighted by Book News, Inc., Portland, OR.
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