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181   $ctxt
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200 10$aRecords of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California
210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d1993
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780818641503 
311 08$a0818641509 
606   $aSemiconductor storage devices$xTesting$xCongresses
606   $aRandom access memory$xCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aSemiconductor storage devices$xTesting$xCongresses.
615  0$aRandom access memory$xCongresses.
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.39/732/0287
702   $aRajsuman$b Rochit
712 02$aIEEE Computer Society Test Technology Technical Committee
712 12$aIEEE International Workshop on Memory Testing
801  0$bPQKB
906   $aBOOK
912   $a9910872723303321
996   $aRecords of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California$92512192
997   $aUNINA