LEADER 01513nam 2200421 450 001 9910827632903321 005 20230803214712.0 035 $a(CKB)3780000000048789 035 $a(FrPJT)JTL20019050 035 $a(MH)014234650-0 035 $a(MiAaPQ)EBC6150763 035 $a(Au-PeEL)EBL6150763 035 $a(OCoLC)1148883971 035 $a(EXLCZ)993780000000048789 100 $a20220523d2014 uy 0 101 0 $afre 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aDes enchantements de Don Quichotte a l'idealisation de la Nation espagnole $eessai sur l'aveuglement psychique et le lien social psychose. /$fClement Tournier 210 1$aParis :$cL'Harmattan,$d[2014] 210 4$dİ2014 215 $a1 online resource (252 p.) 311 $a2-35260-119-3 311 $a2-336-35662-7 606 $aNationalism$zSpain 615 0$aNationalism 676 $a320.540946 700 $aTournier$b Cle?ment$01141455 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910827632903321 996 $aDes enchantements de Don Quichotte a l'idealisation de la Nation espagnole$93961928 997 $aUNINA 999 $aThis Record contains information from the Harvard Library Bibliographic Dataset, which is provided by the Harvard Library under its Bibliographic Dataset Use Terms and includes data made available by, among others the Library of Congress LEADER 01845oam 2200481zu 450 001 9910872708003321 005 20241212214824.0 035 $a(CKB)111026746705932 035 $a(SSID)ssj0000450946 035 $a(PQKBManifestationID)12173472 035 $a(PQKBTitleCode)TC0000450946 035 $a(PQKBWorkID)10444463 035 $a(PQKB)11022057 035 $a(EXLCZ)99111026746705932 100 $a20160829d1992 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$aDiscover the new world of test and design : International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA 210 31$a[Place of publication not identified]$cThe Conference$d1992 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a9780780307605 311 08$a0780307607 606 $aIntegrated circuits$xTesting$vCongresses 606 $aAutomatic test equipment$vCongresses 606 $aElectrical & Computer Engineering$2HILCC 606 $aEngineering & Applied Sciences$2HILCC 606 $aElectrical Engineering$2HILCC 615 0$aIntegrated circuits$xTesting 615 0$aAutomatic test equipment 615 7$aElectrical & Computer Engineering 615 7$aEngineering & Applied Sciences 615 7$aElectrical Engineering 676 $a621.3815/028/7 712 02$aIEEE Computer Society Test Technology Technical Committee 712 02$aInstitute of Electrical and Electronics Engineers Philadelphia Section. 712 12$aInternational Test Conference 801 0$bPQKB 906 $aBOOK 912 $a9910872708003321 996 $aDiscover the new world of test and design : International Test Conference 1992 proceedings : September 20-24, 1992, Convention Center, Baltimore, MD, USA$92526020 997 $aUNINA