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200 10$aProceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France
210 31$a[Place of publication not identified]$cIEEE Computer Society$d2002
300   $aBibliographic Level Mode of Issuance: Monograph
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606   $aSemiconductor storage devices$xTesting$vCongresses
606   $aRandom access memory$vCongresses
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615  0$aSemiconductor storage devices$xTesting
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712 02$aIEEE Computer Society Technical Council on Test Technology.
712 02$aIEEE Computer Society Technical Committee on VLSI,
712 12$aIEEE International Workshop on Memory Technology, Design, and Testing.
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996   $aProceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France$92372861
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