LEADER 01458oam 2200409zu 450 001 9910872682503321 005 20241212214844.0 035 $a(CKB)111026746717182 035 $a(SSID)ssj0000455238 035 $a(PQKBManifestationID)12168696 035 $a(PQKBTitleCode)TC0000455238 035 $a(PQKBWorkID)10399725 035 $a(PQKB)11635426 035 $a(NjHacI)99111026746717182 035 $a(EXLCZ)99111026746717182 100 $a20160829d1997 uy 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$a1996 IEEE International Integrated Reliability Workshop Final Report 210 31$a[Place of publication not identified]$cIEEE$d1997 215 $a1 online resource (175 pages) 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a9780780335981 311 08$a0780335988 330 $aThe International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. The 1996 Final Report includes papers, abstracts, and summaries from the conference. 606 $aIntegrated circuits$vCongresses 615 0$aIntegrated circuits 676 $a621.3815 712 02$aIEEE, Society Staff 801 0$bPQKB 906 $aBOOK 912 $a9910872682503321 996 $a1996 IEEE International Integrated Reliability Workshop Final Report$92539628 997 $aUNINA