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100   $a20160829d1988      uy 
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$aNew frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC
210 31$a[Place of publication not identified]$cComputer Society Press of the IEEE$d1988
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780818608704 
311 08$a0818608706 
606   $aIntegrated circuits$xTesting$vCongresses
606   $aElectronic digital computers$xTesting$xCircuits$vCongresses
606   $aAutomatic test equipment$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIntegrated circuits$xTesting
615  0$aElectronic digital computers$xTesting$xCircuits
615  0$aAutomatic test equipment
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.395
712 02$aIEEE Computer Society Test Technology Technical Committee
712 02$aInstitute of Electrical and Electronics Engineers Philadelphia Section.
712 12$aInternational Test Conference
801  0$bPQKB
906   $aBOOK
912   $a9910872681703321
996   $aNew frontiers in testing : International Test Conference, 1988 proceedings, September 12, 13, 14, 1988, Sheraton Washington Hotel, Washington, DC$92527689
997   $aUNINA