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024 7 $a10.1109/RELPHY.1998
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100   $a20160829d1998      uy 
101 0 $aeng
135   $aur|||||||||||
181   $ctxt
182   $cc
183   $acr
200 10$a1998 IEEE International Reliability Physics Symposium
210 31$a[Place of publication not identified]$cIEEE$d1998
215   $a1 online resource (400 pages)
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780780344006 
311 08$a0780344006 
330   $aThe IRPS deals with physical mechanisms that reduce the reliability or performance of integrated circuits and microelectronics derived in the user's environment. This conference covers the identification of new microelectronic failure or degradation mechanisms.
606   $aElectronic apparatus and appliances$xReliability$vCongresses
606   $aIntegrated circuits$xReliability$vCongresses
615  0$aElectronic apparatus and appliances$xReliability
615  0$aIntegrated circuits$xReliability
676   $a621.381
712 02$aIEEE, Institute of Electrical and Electronics Engineers, Inc. Staff
801  0$bPQKB
906   $aPROCEEDING
912   $a9910872647503321
996   $a1998 IEEE International Reliability Physics Symposium$92508687
997   $aUNINA