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100   $a20160829d1996      uy 
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$aDigest of papers : 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, D.C
210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d1996
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780818676550 
311 08$a0818676558 
606   $aIddq testing$xCongresses
606   $aMetal oxide semiconductors, Complementary$xTesting$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIddq testing$xCongresses.
615  0$aMetal oxide semiconductors, Complementary$xTesting
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.39/732
702   $aTong$b Carol
702   $aJayasumana$b Anura P
712 02$aIEEE Computer Society.$bTechnical Committee on Test Technology.
801  0$bPQKB
906   $aBOOK
912   $a9910872646303321
996   $aDigest of papers : 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, D.C$92346866
997   $aUNINA