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200 10$aIEEE International Workshop on IDDQ Testing : digest of papers, November 5-6, 1997, Washington, D.C
210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d1997
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-8186-8123-3 
606   $aIddq testing$xCongresses
606   $aMetal oxide semiconductors, Complementary$xTesting$xCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIddq testing$xCongresses
615  0$aMetal oxide semiconductors, Complementary$xTesting$xCongresses
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.39/5/0287
702   $aJayasumana$b Anura P
712 02$aIEEE Computer Society Technical Test Technology Committee.
801  0$bPQKB
906   $aBOOK
912   $a9910872626003321
996   $aIEEE International Workshop on IDDQ Testing : digest of papers, November 5-6, 1997, Washington, D.C$92390261
997   $aUNINA