LEADER 01666oam  2200469zu 450 
001 9910872615003321
005 20241212214930.0
035   $a(CKB)111026746724010
035   $a(SSID)ssj0000396610
035   $a(PQKBManifestationID)12146167
035   $a(PQKBTitleCode)TC0000396610
035   $a(PQKBWorkID)10343668
035   $a(PQKB)11250567
035   $a(EXLCZ)99111026746724010
100   $a20160829d1999      uy 
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$a1999 4th International Workshop on Statistical Metrology
210 31$a[Place of publication not identified]$cPurchased from IEEE Service Center Single Publication Sales Unit$d1999
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780780351547 
311 08$a0780351541 
606   $aSemiconductors$xCharacterization$xStatistical methods$vCongresses
606   $aSemiconductors$xMeasurement$vCongresses
606   $aElectrical Engineering$2HILCC
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aSemiconductors$xCharacterization$xStatistical methods
615  0$aSemiconductors$xMeasurement
615  7$aElectrical Engineering
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
676   $a621.3815/2/0287
712 02$aIEEE Electron Devices Society
712 12$aInternational Workshop on Statistical Metrology
801  0$bPQKB
906   $aPROCEEDING
912   $a9910872615003321
996   $a1999 4th International Workshop on Statistical Metrology$92546904
997   $aUNINA