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200 10$a2005 ROCS Workshop : proceedings : October 30, 2005, Palm Springs, California
210 31$a[Place of publication not identified]$cJEDEC$d2005
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7908-0106-X 
606   $aGallium arsenide semiconductors$xReliability$vCongresses
606   $aSemiconductors$xMaterials$vCongresses
606   $aSemiconductors$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aGallium arsenide semiconductors$xReliability
615  0$aSemiconductors$xMaterials
615  0$aSemiconductors
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
712 02$aIEEE Electron Devices Society
712 02$aJEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
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996   $a2005 ROCS Workshop : proceedings : October 30, 2005, Palm Springs, California$92534678
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