LEADER 01787oam 2200469zu 450 001 9910872528703321 005 20210807000254.0 035 $a(CKB)1000000000021767 035 $a(SSID)ssj0000394401 035 $a(PQKBManifestationID)12104692 035 $a(PQKBTitleCode)TC0000394401 035 $a(PQKBWorkID)10387917 035 $a(PQKB)10074947 035 $a(EXLCZ)991000000000021767 100 $a20160829d2004 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$aDELTA 2004 : second IEEE International Workshop on Electronic Design, Test and Applications : proceedings, 28-30 January 2004, Perth, Australia 210 31$a[Place of publication not identified]$cIEEE Computer Society$d2004 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-7695-2081-2 606 $aElectronics$xDesign$vCongresses 606 $aElectronics$xTesting$vCongresses 606 $aElectrical & Computer Engineering$2HILCC 606 $aElectrical Engineering$2HILCC 606 $aEngineering & Applied Sciences$2HILCC 615 0$aElectronics$xDesign 615 0$aElectronics$xTesting 615 7$aElectrical & Computer Engineering 615 7$aElectrical Engineering 615 7$aEngineering & Applied Sciences 676 $a621.381 712 02$aAustralian Microelectronics Network 712 02$aIEEE Computer Society Technical Council on Test Technology. 712 12$aIEEE International Workshop on Electronic Design, Test and Applications 801 0$bPQKB 906 $aPROCEEDING 912 $a9910872528703321 996 $aDELTA 2004 : second IEEE International Workshop on Electronic Design, Test and Applications : proceedings, 28-30 January 2004, Perth, Australia$92378644 997 $aUNINA