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200 10$aDBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA
210 31$a[Place of publication not identified]$cIEEE$d2004
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780780389502 
311 08$a0780389506 
606   $aMetal oxide semiconductors, Complementary$xDefects$vCongresses
606   $aIntegrated circuits$vCongresses
606   $aIddq testing$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aElectrical Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aMetal oxide semiconductors, Complementary$xDefects
615  0$aIntegrated circuits
615  0$aIddq testing
615  7$aElectrical & Computer Engineering
615  7$aElectrical Engineering
615  7$aEngineering & Applied Sciences
676   $a621.39/732
702   $aMenon$b Sankaran M
712 02$aIEEE Computer Society Test Technology Technical Committee
712 12$aIEEE International Workshop on Defect Based Testing
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996   $aDBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA$92324854
997   $aUNINA