LEADER 02024oam  2200517zu 450 
001 9910872509303321
005 20210806235726.0
035   $a(CKB)1000000000021966
035   $a(SSID)ssj0000394745
035   $a(PQKBManifestationID)12171889
035   $a(PQKBTitleCode)TC0000394745
035   $a(PQKBWorkID)10388755
035   $a(PQKB)11789495
035   $a(EXLCZ)991000000000021966
100   $a20160829d2005      uy 
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$a5th International Workshop on Microprocessor Test and Verification : common challenges and solutions : proceedings : Austin, Texas, September 9-10, 2004
210 31$a[Place of publication not identified]$cIEEE Computer Society$d2005
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-2320-X 
606   $aMicroprocessors$xTesting$vCongresses
606   $aIntegrated circuits$xTesting$vCongresses
606   $aIntegrated circuits$xVerification$vCongresses
606   $aSystems on a chip$xTesting$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aElectrical Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aMicroprocessors$xTesting
615  0$aIntegrated circuits$xTesting
615  0$aIntegrated circuits$xVerification
615  0$aSystems on a chip$xTesting
615  7$aElectrical & Computer Engineering
615  7$aElectrical Engineering
615  7$aEngineering & Applied Sciences
676   $a004.16
712 02$aIEEE Xplore (Online service)
712 02$aIEEE Computer Society Technical Council on Test Technology.
712 12$aInternational Workshop on Microprocessor Test and Verification
801  0$bPQKB
906   $aPROCEEDING
912   $a9910872509303321
996   $a5th International Workshop on Microprocessor Test and Verification : common challenges and solutions : proceedings : Austin, Texas, September 9-10, 2004$92350004
997   $aUNINA