LEADER 01432oam  2200433zu 450 
001 9910872506903321
005 20241212214927.0
024 7 $a10.1109/IWSTM.2000
035   $a(CKB)111026746728422
035   $a(SSID)ssj0000454694
035   $a(PQKBManifestationID)12160803
035   $a(PQKBTitleCode)TC0000454694
035   $a(PQKBWorkID)10398467
035   $a(PQKB)11516397
035   $a(NjHacI)99111026746728422
035   $a(EXLCZ)99111026746728422
100   $a20160829d2000      uy 
101 0 $aeng
135   $aur|||||||||||
181   $ctxt
182   $cc
183   $acr
200 10$a2000 5th International Workshop on Statistical Metrology
210 31$a[Place of publication not identified]$cI E E E$d2000
215   $a1 online resource (90 pages) $cillustrations
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780780358966 
311 08$a0780358961 
606   $aSemiconductors$xCharacterization$xStatistical methods$vCongresses
606   $aSemiconductors$vCongresses
615  0$aSemiconductors$xCharacterization$xStatistical methods
615  0$aSemiconductors
676   $a621.3815/2/0287
712 02$aIEEE, Institute of Electrical and Electronics Engineers, Inc. Staff
801  0$bPQKB
906   $aPROCEEDING
912   $a9910872506903321
996   $a2000 5th International Workshop on Statistical Metrology$92530469
997   $aUNINA