LEADER 01716oam  2200493zu 450 
001 9910872496403321
005 20210806235947.0
035   $a(CKB)1000000000022450
035   $a(SSID)ssj0000395615
035   $a(PQKBManifestationID)12144176
035   $a(PQKBTitleCode)TC0000395615
035   $a(PQKBWorkID)10456783
035   $a(PQKB)10339824
035   $a(EXLCZ)991000000000022450
100   $a20160829d2004      uy 
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$a2004 1st IEEE Lightwave Technologies in Instrumentation and Measurement Conference : Palisades, NY, 19-20 October, 2004
210 31$a[Place of publication not identified]$cIEEE$d2004
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-8723-6 
311   $a0-7803-8722-8 
606   $aElectrooptics$vCongresses
606   $aElectrooptical devices$vCongresses
606   $aPhotometry$vCongresses
606   $aOptical measurements$vCongresses
606   $aEngineering & Applied Sciences$2HILCC
606   $aApplied Physics$2HILCC
615  0$aElectrooptics
615  0$aElectrooptical devices
615  0$aPhotometry
615  0$aOptical measurements
615  7$aEngineering & Applied Sciences
615  7$aApplied Physics
676   $a621.381/045
712 02$aIEEE Metropolitan Sections Activities Council
712 12$aIEEE Lightwave Technologies in Instrumentation and Measurement Conference
801  0$bPQKB
906   $aPROCEEDING
912   $a9910872496403321
996   $a2004 1st IEEE Lightwave Technologies in Instrumentation and Measurement Conference : Palisades, NY, 19-20 October, 2004$92539082
997   $aUNINA