LEADER 01986oam 2200433zu 450 001 9910872487603321 005 20241212215431.0 035 $a(CKB)1000000000278178 035 $a(SSID)ssj0000454136 035 $a(PQKBManifestationID)12158199 035 $a(PQKBTitleCode)TC0000454136 035 $a(PQKBWorkID)10487947 035 $a(PQKB)10056857 035 $a(NjHacI)991000000000278178 035 $a(EXLCZ)991000000000278178 100 $a20160829d2004 uy 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$a2004 IEEE International High-Level Design Validation and Test Workshop 210 31$a[Place of publication not identified]$cI E E E$d2004 215 $a1 online resource 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a9780780387140 311 08$a0780387147 327 $aHLDVT'04 - Ninth Annual IEEE International Workshop on High Level Design Validation and Test -- Proceedings. Ninth IEEE International High-Level Design Validation and Test Workshop (IEEE Cat. No.04EX940) -- Copyright -- Chairs' welcome message -- Committees -- Table of contents -- TTTC: test technology technical council -- Session 1: formal techniques -- Enhancing sequential depth computation with a branch-and-bound algorithm -- Reference model based RTL verification: an integrated approach -- Dynamic guiding of bounded property checking -- Towards an efficient assertion based verification of SystemC designs. 330 $aThis page or pages intentionally left blank. 606 $aComputer software$xVerification$vCongresses 606 $aElectronic circuits$xTesting$vCongresses 615 0$aComputer software$xVerification 615 0$aElectronic circuits$xTesting 676 $a005.14 801 0$bPQKB 906 $aPROCEEDING 912 $a9910872487603321 996 $a2004 IEEE International High-Level Design Validation and Test Workshop$92386429 997 $aUNINA