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200 10$a2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002
210 31$a[Place of publication not identified]$cIEEE Society$d2002
300   $aBibliographic Level Mode of Issuance: Monograph
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615  7$aEngineering & Applied Sciences
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712 02$aIEEE Electron Devices Society
712 12$aInternational Integrated Reliability Workshop
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996   $a2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002$92513244
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