LEADER 04588nam 22006495 450 001 9910865272403321 005 20240628122220.0 010 $a9783031488474$b(electronic bk.) 010 $z9783031488467 024 7 $a10.1007/978-3-031-48847-4 035 $a(MiAaPQ)EBC31364706 035 $a(Au-PeEL)EBL31364706 035 $a(CKB)32227914900041 035 $a(DE-He213)978-3-031-48847-4 035 $a(OCoLC)1438672646 035 $a(EXLCZ)9932227914900041 100 $a20240603d2024 u| 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aExtraction of Semiconductor Diode Parameters $eA Comparative Review of Methods and Materials /$fby Richard Ocaya 205 $a1st ed. 2024. 210 1$aCham :$cSpringer Nature Switzerland :$cImprint: Springer,$d2024. 215 $a1 online resource (188 pages) 311 08$aPrint version: Ocaya, Richard Extraction of Semiconductor Diode Parameters Cham : Springer,c2024 9783031488467 327 $aDetermining p-n Junction Band Gap -- Review of Metal-Semiconductor Junctions -- Contemporary Parameter Extraction Methods -- Transient Methods -- New Parameter Extraction Techniques -- p-n Diode Parameter Extraction -- Novel Unified Method -- Artifical Intelligence Parameter Extraction Methods. 330 $aThis book presents a comprehensive treatise on the extraction of semiconductor diode parameters using various methods. Its focus is on metal-semiconductor, metal-insulator-semiconductor, and p-n junction diodes, covering a wide range of metals and semiconductors, including elemental, compound, organic, and nanostructured materials. By bringing together these methods in one place, this book provides a much-needed standardized point of reference for the field. The methods used for device characterization have spread widely but not yet critically compared and contrasted. This book aims to bridge this gap by offering a comparative review of the methods and providing the most accurate information on current developments. The result is a valuable resource for researchers and practitioners who seek to optimize their use of semiconductor diodes in their work. With its thorough coverage and critical analysis, this book fills a large void in the field of semiconductor device characterization. It is an essential reference for anyone interested in the extraction of semiconductor diode parameters using a variety of methods. "Extraction of Semiconductor Diode Parameters: A Comparative Review of Methods and Materials" is an invaluable resource for anyone in the field. The book brilliantly fulfills its mission to encapsulate the latest developments in semiconductor diodes, providing comprehensive coverage of various materials and crucial parameters. Its comparative analysis of extraction methods, attention to series resistance, and exploration of emerging 2D materials make it a standout in the literature. Moreover, the book's dedication to addressing the impact of artificial intelligence is commendable. As a testament to the author's commitment to empowering researchers and engineers, this book is a must-have companion for those seeking to unlock the full potential of semiconductor devices, making it an indispensable reference in this rapidly evolving field. Prof. Yakuphanoglu, Department of Physics, Faculty of Science, Firat University, Elazig, Turkey Prof. Kwadwo Mensah - Darkwa, Department of Materials Engineering, Faculty of Mechanical and Chemical Engineering, College of Engineering, Kwame Nkrumah University of Science and Technology, Kumasi - Ghana. 606 $aSemiconductors 606 $aSolid state physics 606 $aOptoelectronic devices 606 $aOptics 606 $aCondensed matter 606 $aSemiconductors 606 $aElectronic Devices 606 $aOptoelectronic Devices 606 $aOptics and Photonics 606 $aCondensed Matter 615 0$aSemiconductors. 615 0$aSolid state physics. 615 0$aOptoelectronic devices. 615 0$aOptics. 615 0$aCondensed matter. 615 14$aSemiconductors. 615 24$aElectronic Devices. 615 24$aOptoelectronic Devices. 615 24$aOptics and Photonics. 615 24$aCondensed Matter. 676 $a621.381522 700 $aOcaya$b Richard$01742888 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 912 $a9910865272403321 996 $aExtraction of Semiconductor Diode Parameters$94169586 997 $aUNINA