LEADER 02030oam 2200505zu 450 001 9910840511503321 005 20210807004009.0 010 $a1-4443-0548-4 010 $a1-4443-0561-1 035 $a(CKB)2500000000001677 035 $a(SSID)ssj0000354667 035 $a(PQKBManifestationID)11925307 035 $a(PQKBTitleCode)TC0000354667 035 $a(PQKBWorkID)10322584 035 $a(PQKB)10480396 035 $a(EXLCZ)992500000000001677 100 $a20160829d2008 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 00$aPrinciples and applications of powder diffraction 210 31$a[Place of publication not identified]$cJohn Wiley and Sons Ltd$d2008 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a1-4051-6222-8 327 $aAn overview of powder diffraction / Lachlan M. D. Cranswick -- Intorduction to diffraction / Abraham Clearfield -- Practical aspects / Joseph H. Reibenspies and Nattamai Bhuvanesh -- Profile analysis / Arnt Kern -- Introduction to non-laboratory radiation sources / Peter J. Chupas and Karena W. Chapman -- Phase identification and quantitative methods / Pamela Whitfield and Lyndon Mitchell -- Structure solution / Armel Le Bail -- Structure refinement / James A. Kaduk -- Other topics / E. Andrew Payzant. 606 $aX-rays$xMeasurement$xDiffraction 606 $aPowders$xOptical properties 606 $aLight & Optics$2HILCC 606 $aPhysics$2HILCC 606 $aPhysical Sciences & Mathematics$2HILCC 615 0$aX-rays$xMeasurement$xDiffraction 615 0$aPowders$xOptical properties 615 7$aLight & Optics 615 7$aPhysics 615 7$aPhysical Sciences & Mathematics 676 $a548/.83 702 $aClearfield$b Abraham 702 $aReibenspies$b Joseph Henry 702 $aBhuvanesh$b Nattamai 801 0$bPQKB 906 $aBOOK 912 $a9910840511503321 996 $aPrinciples and applications of powder diffraction$94136874 997 $aUNINA