LEADER 01071nam2-2200361---450 001 990005595480203316 005 20200514183258.0 035 $a000559548 035 $aUSA01000559548 035 $a(ALEPH)000559548USA01 035 $a000559548 100 $a19981214e19951829|||y0itaa50------ba 101 $aeng 102 $agb 105 $a0 00||| 200 1 $aAnalysis of the phenomena of the human mind. Vol. 1$fJames Mill 205 $a2nd imp 210 $aLondon$cRoutledge Thoemmes press$d1995 215 $aIV, 320 p.$d22 cm 461 0$1001000559546$12001$a<> collected works of James Mill$v1 620 $dLONDON 676 $a144.6 700 1$aMILL,$bJames$0484519 801 0$aIT$bSA$c20111219 912 $a990005595480203316 950 0$aDipar.to di Filosofia - Salerno$dDFAA 144.6 MIL$e1608 FIL 951 $aAA 144.6 MIL$b1608 FIL 959 $aBK 969 $aFIL 979 $c20121027$lUSA01$h1525 979 $c20121027$lUSA01$h1614 996 $aAnalysis of the phenomena of the human mind. Vol. 1$91132460 997 $aUNISA LEADER 04277nam 22007335 450 001 9910831013903321 005 20240311135420.0 010 $a3-031-44233-4 024 7 $a10.1007/978-3-031-44233-9 035 $a(MiAaPQ)EBC31131791 035 $a(Au-PeEL)EBL31131791 035 $a(MiAaPQ)EBC31132535 035 $a(Au-PeEL)EBL31132535 035 $a(DE-He213)978-3-031-44233-9 035 $a(CKB)30316761900041 035 $a(EXLCZ)9930316761900041 100 $a20240206d2024 u| 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aActive Probe Atomic Force Microscopy $eA Practical Guide on Precision Instrumentation /$fby Fangzhou Xia, Ivo W. Rangelow, Kamal Youcef-Toumi 205 $a1st ed. 2024. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2024. 215 $a1 online resource (383 pages) 311 08$aPrint version: Xia, Fangzhou Active Probe Atomic Force Microscopy Cham : Springer International Publishing AG,c2024 9783031442322 327 $aIntroduction -- Active Probe Design and Fabrication -- Advanced Applications of Active Probes -- Atomic Force Microscope Designs -- AFM System using Active Probe -- A Low-cost AFM Design for Engineering Education -- Appendix. 330 $aFrom a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, sensors, actuators, transmission design, system identification, signal processing, dynamic system modeling, controller. With a solid theoretical foundation, practical examples are provided for AFM subsystem level design on nano-positioning system, cantilever probe, control system and system integration. This book emphasizes novel development of active cantilever probes with embedded transducers, which enables new AFM capabilities for advanced applications. Full design details of a low-cost educational AFM and a Scale Model Interactive Learning Extended Reality (SMILER) toolkit are provided, which helps instructors to make use of this book for curriculum development. This book aims to empower AFM users with deeper understanding of theinstrument to extend AFM functionalities for advanced state-of-the-art research studies. Going beyond AFM, materials presented in this book are widely applicable to precision mechatronic system design covered in many upper-level graduate courses in mechanical and electrical engineering to cultivate next generation instrumentalists. Presents the instrument design details of atomic force microscopy with focus on active cantilever probes; Includes examples and exercises to boost understanding of AFM subsystem design, fabrication and integration; Imparts a hands-on curriculum for precision mechatronics and instrumentation with AFM and digital twin simulators. 606 $aMeasurement 606 $aMeasuring instruments 606 $aElectronics 606 $aMechatronics 606 $aSpectrum analysis 606 $aMicrotechnology 606 $aMicroelectromechanical systems 606 $aMeasurement Science and Instrumentation 606 $aElectronics and Microelectronics, Instrumentation 606 $aMechatronics 606 $aSpectroscopy 606 $aMicrosystems and MEMS 615 0$aMeasurement. 615 0$aMeasuring instruments. 615 0$aElectronics. 615 0$aMechatronics. 615 0$aSpectrum analysis. 615 0$aMicrotechnology. 615 0$aMicroelectromechanical systems. 615 14$aMeasurement Science and Instrumentation. 615 24$aElectronics and Microelectronics, Instrumentation. 615 24$aMechatronics. 615 24$aSpectroscopy. 615 24$aMicrosystems and MEMS. 676 $a502.82 700 $aXia$b Fangzhou$01631646 701 $aRangelow$b Ivo W$01631647 701 $aYoucef-Toumi$b Kamal$025116 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910831013903321 996 $aActive Probe Atomic Force Microscopy$93970445 997 $aUNINA