LEADER 05199nam 2200529 450 001 9910830936703321 005 20230808194845.0 010 $a1-119-32963-9 010 $a1-119-32965-5 035 $a(CKB)3710000000831074 035 $a(MiAaPQ)EBC4648724 035 $a(EXLCZ)993710000000831074 100 $a20160903h20162016 uy 0 101 0 $aeng 135 $aurcnu|||||||| 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aNanometer-scale defect detection using polarized light /$fPierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami 210 1$aLondon, England ;$aHoboken, New Jersey :$cISTE :$cWiley,$d2016. 210 4$dİ2016 215 $a1 online resource (320 pages) $cillustrations 225 1 $aMechanical Engineering and Solid Mechanics Series 225 1 $aReliability of multiphysical systems set ;$vVolume 2 311 $a1-84821-936-9 320 $aIncludes bibliographical references and index. 327 $aCover; Title Page; Copyright ; Contents; Preface; 1. Uncertainties; 1.1. Introduction; 1.2. The reliability based design approach; 1.2.1. The MC method; 1.2.2. The perturbation method; 1.2.3. The polynomial chaos method; 1.3. The design of experiments method; 1.3.1. Principle; 1.3.2. The Taguchi method; 1.4. The set approach; 1.4.1. The method of intervals; 1.4.2. Fuzzy logic based method; 1.5. Principal component analysis; 1.5.1. Description of the process; 1.5.2. Mathematical roots; 1.5.3. Interpretation of results; 1.6. Conclusions; 2. Reliability-based Design Optimization 327 $a2.1. Introduction2.2. Deterministic design optimization; 2.3. Reliability analysis; 2.3.1. Optimal conditions; 2.4. Reliability-based design optimization; 2.4.1. The objective function; 2.4.2. Total cost consideration; 2.4.3. The design variables; 2.4.4. Response of a system by RBDO; 2.4.5. Limit states; 2.4.6. Solution techniques; 2.5. Application: optimization of materials of an electronic circuit board; 2.5.1. Optimization problem; 2.5.2. Optimization and uncertainties; 2.5.3. Results analysis; 2.6. Conclusions; 3. The Wave-Particle Nature of Light; 3.1. Introduction 327 $a3.2. The optical wave theory of light according to Huyghens and Fresnel3.2.1. The three postulates of wave optics; 3.2.2. Luminous power and energy; 3.2.3. The monochromatic wave; 3.3. The electromagnetic wave according to Maxwell's theory; 3.3.1. The Maxwell equations; 3.3.2. The wave equation according to the Coulomb's gauge; 3.3.3. The wave equation according to the Lorenz's gauge; 3.4. The quantum theory of light; 3.4.1. The annihilation and creation operators of the harmonic oscillator; 3.4.2. The quantization of the electromagnetic field and the potential vector 327 $a3.4.3. Field modes in the second quantization4. The Polarization States of Light; 4.1. Introduction; 4.2. The polarization of light by the matrix method; 4.2.1. The Jones representation of polarization; 4.2.2. The Stokes and Muller representation of polarization; 4.3. Other methods to represent polarization; 4.3.1. The Poincar?e description of polarization; 4.3.2. The quantum description of polarization; 4.4. Conclusions; 5. Interaction of Light and Matter; 5.1. Introduction; 5.2. Classical models; 5.2.1. The Drude model; 5.2.2. The Sellmeir and Lorentz models 327 $a5.3. Quantum models for light and matter5.3.1. The quantum description of matter; 5.3.2. Jaynes-Cummings model; 5.4. Semiclassical models; 5.4.1. Tauc-Lorentz model; 5.4.2. Cody-Lorentz model; 5.5. Conclusions; 6. Experimentation and Theoretical Models; 6.1. Introduction; 6.2. The laser source of polarized light; 6.2.1. Principle of operation of a laser; 6.2.2. The specificities of light from a laser; 6.3. Laser-induced fluorescence; 6.3.1. Principle of the method; 6.3.2. Description of the experimental setup; 6.4. The DR method; 6.4.1. Principle of the method 327 $aDefects in a heterogeneous medium -- Defects at the interfaces -- Application to nanomaterials. 330 $aThis book describes experimental and theoretical methods that are implemented within the framework of fundamental research to better understand physical and chemical processes at the nanoscale that are responsible for the remarkable properties of materials used in innovative technological devices. It presents optical techniques based on polarized light allowing the characterization of defects in materials or in their interfaces that are likely to impact performance. It also describes ways of knowing mechanical properties of nanomaterials by using theoretical models and analysis of experimental results and their uncertainties. 410 0$aMechanical engineering and solid mechanics series. 606 $aNanostructured materials 615 0$aNanostructured materials. 676 $a620.115 700 $aDahoo$b Pierre Richard$0924208 702 $aPougnet$b Philippe 702 $aEl Hami$b Abdelkhalak 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910830936703321 996 $aNanometer-scale defect detection using polarized light$93982536 997 $aUNINA