LEADER 03681nam 2200613 a 450 001 9910830751403321 005 20230617034437.0 010 $a1-280-67391-5 010 $a9786613650849 010 $a1-118-40720-2 010 $a1-118-40722-9 035 $a(CKB)2670000000175125 035 $a(EBL)894434 035 $a(SSID)ssj0000631673 035 $a(PQKBManifestationID)11372276 035 $a(PQKBTitleCode)TC0000631673 035 $a(PQKBWorkID)10599389 035 $a(PQKB)11514184 035 $a(MiAaPQ)EBC894434 035 $a(OCoLC)795998939 035 $a(EXLCZ)992670000000175125 100 $a20050713d2005 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aAdvanced dielectric, piezoelectric and ferroelectric thin films$b[electronic resource] $eproceedings of the 106th Annual Meeting of the American Ceramic Society, Indianapolis, Indiana, USA (2004) /$feditors, Bruce A. Tuttle ... [et al.] 210 $aWesterville, Ohio $cAmerican Ceramic Society$dc2005 215 $a1 online resource (98 p.) 225 1 $aCeramic transactions ;$vv. 162 300 $a"... selected papers from the Advanced Dielectric, Piezoelectric and Ferroelectric Thin Films Symposium held at the American Ceramic Society's 106th Annual Meeting, April 18-21, 2004 in Indianapolis, Indiana."--p. vii. 311 $a1-57498-183-8 320 $aIncludes bibliographical references and indexes. 327 $aAdvanced Dielectric, Piezoelectric and Ferroelectric Thin Films; Contents; Preface; Chemical Solution Deposition of CaCu3Ti4O12 Thin Films; The Temporal Effects in DC-Biased PbNb(Zr,Sn,Ti)O3; High Energy Density PLZT Thin Film Capacitors; Reliability Studies on Sputter Deposited Barium Strontium Titanate Thin Film Capacitors; Raman Study of Effects of Excess Bi Content in Metalorganic Derived Bi4Ti3O12 Films; High Dielectric Tunability Ferroelectric (Pb,Sr)TiO3 Thin Films for Room Temperature Tunable Microwave Devices; Fabrication of Self-Assembled Nanostrutures of Microwave Dielectrics 327 $aEpitaxial Phase Selection in the Rare Earth Manganite SystemMulti-Ferroic BiFeO3 Films Prepared by Liquid Phase Epitaxy and Sol-Gel Methods; Effect of Argon Addition During ECR Mode Nucleation of Diamond Films Grown by MPCVD; Author Index; Keyword Index 330 $aAdvances in synthesis and characterization of dielectric, piezoelectric and ferroelectric thin films are included in this volume. Dielectric, piezoelectric and ferroelectric thin films have a tremendous impact on a variety of commercial and military systems including tunable microwave devices, memories, MEMS devices, actuators and sensors. Recent work on piezoelectric characterization, AFE to FE dielectric phase transformation dielectrics, solution and vapor deposited thin films, and materials integration are among the topics included. Novel approaches to nanostructuring, characterization of m 410 0$aCeramic transactions ;$vv. 162. 606 $aThin films$xMaterials$vCongresses 606 $aThin film devices$vCongresses 615 0$aThin films$xMaterials 615 0$aThin film devices 676 $a621.3815/2 676 $a621.38152 701 $aTuttle$b Bruce$0867744 712 02$aAmerican Ceramic Society Meeting 712 12$aAdvanced Dielectric, Piezoelectric and Ferroelectric Thin Films Symposium$f(2004 :$eIndianapolis, Ind.) 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910830751403321 996 $aAdvanced dielectric, piezoelectric and ferroelectric thin films$91936843 997 $aUNINA