LEADER 02620nam 2200469 450 001 9910830710803321 005 20210310142809.0 010 $a1-119-66394-6 010 $a1-119-66401-2 035 $a(CKB)4100000011766943 035 $a(MiAaPQ)EBC6478259 035 $a(Au-PeEL)EBL6478259 035 $a(OCoLC)1237866012 035 $a(BIP)076875165 035 $a(EXLCZ)994100000011766943 100 $a20210310d2021 uy 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aAccelerated life testing of one-shot devices $edata collection and analysis /$fNarayanaswamy Balakrishnan, Man Ho Ling, Hon Yiu So 210 1$aHoboken, New Jersey :$cWiley,$d[2021] 210 4$d2021 215 $a1 online resource (243 pages) 311 $a1-119-66400-4 330 $a"A one-shot device is a unit that performs its function only once and cannot be used for testing more than once. Examples include electric explosive devices, fire extinguishers, airbags in cars, and missiles. While testing one-shot devices, only the condition of the device at a specific inspection time can be recorded, and exact failure times cannot be obtained from the test. As a result, the lifetimes of devices are either left- or right-censored. Due to a lack of lifetime data collected in life-tests, estimating the reliability of one-shot devices in traditional approaches becomes challenging. This book primarily focuses on fundamental issues of statistical modeling based on one-shot device testing data collected from accelerated life-tests. This book also provides advanced statistical techniques. For instance, expectation-maximization algorithms and Bayesian approaches to deal with the estimation challenges, along with comprehensive data analysis of one-shot devices under accelerated life-tests. Readers may apply the techniques from this book to their own lifetime data with censoring. This book is ideal for graduate students, researchers, and engineers working on accelerated life testing data analysis"--$cProvided by publisher. 606 $aAccelerated life testing 610 $aEngineering 610 $aTechnology & Engineering 615 0$aAccelerated life testing. 676 $a620.00452 700 $aBalakrishnan$b N.$f1956-$0103508 702 $aLing$b Man Ho 702 $aSo$b Hon Yiu 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910830710803321 996 $aAccelerated life testing of one-shot devices$93932667 997 $aUNINA