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Dibvadio$b[electronic resource] 210 $aCopenhagen $cMatthiæ Vinitor$d1597 215 $aOnline resource ([12] bl.) 300 $aReproduction of original in Det Kongelige Bibliotek / The Royal Library (Copenhagen). 700 $aDybvad$b Georg Christoph$f1549-1612.$0854819 701 $aDibvadius$b Georgius Christophorus$f1549-1612.$0865945 701 $aDibvadius$b Georgius Christophorus$f1549-1612.$0865945 701 $aResen$b Hans Poulsen$cBishop,$f1561-1638.$0865905 801 0$bUk-CbPIL 801 1$bUk-CbPIL 906 $aBOOK 912 $a9910482698303321 996 $aTheses, quibus repetitvr svmma veræ et incorruptæ doctrinæ, quam nostræ Ecclesiæ profitentur, de bonis operibus ... Disputabit ... Joh. Pavl. Resenivs ; præside Georgio C. Dibvadio$92107288 997 $aUNINA LEADER 00895nam0-2200277 --450 001 9910646888403321 005 20230301140024.0 100 $a20230301d1978----kmuy0itay5050 ba 101 0 $afre 102 $aBE 105 $a 001yy 200 1 $aNatures de l'espace$eHenri Pousseur, Gary Bigot, Michel Boulanger$eBiennale de Venise, 1978, Communauté française de Belgique 210 $aBruxelles$cLebeer Hossmann$d[1978?] 215 $a[85] p.$cill.$d22x22 cm 300 $aCatalogo della Mostra 610 0 $aEsposizioni$aCataloghi 702 1$aBoulanger,$bMichel 702 1$aBigot,$bGary 712 12$aEsposizione internazionale d'arte$d<38.$f; 1978$e; Venezia> 801 0$aIT$bUNINA$gREICAT$2UNIMARC 901 $aBK 912 $a9910646888403321 952 $aFONDO ROSSI 4309$bROSSI 4430$fFARBC 959 $aFARBC 996 $aNatures de l'espace$93012494 997 $aUNINA LEADER 01041nam a22002531i 4500 001 991002671219707536 005 20040225093500.0 008 040624s1959 it a||||||||||||||||ita 035 $ab12959716-39ule_inst 035 $aARCHE-091739$9ExL 040 $aDip.to Beni Culturali$bita$cA.t.i. Arché s.c.r.l. 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Chevallier 260 $aFirenze :$bCoi Tipi dell'Istituto geografico militare,$c1959 300 $a63 p. :$bill. ;$c24 cm 650 4$aAerofotogrammetria 700 1 $aChevallier, Raymond 907 $a.b12959716$b02-04-14$c12-07-04 912 $a991002671219707536 945 $aLE001 M 8 8$g1$i2001000042746$lle001$nC. 1$o-$pE0.00$q-$rl$s- $t0$u1$v0$w1$x0$y.i13560980$z12-07-04 996 $aCaulonia e Metaponto$9280181 997 $aUNISALENTO 998 $ale001$b12-07-04$cm$da $e-$fita$git $h0$i1 LEADER 01760oam 2200433I 450 001 9910704989203321 005 20131204161613.0 035 $a(CKB)5470000002445850 035 $a(OCoLC)862066504 035 $a(EXLCZ)995470000002445850 100 $a20131104d2013 ua 0 101 0 $aeng 135 $aurmn||||||||| 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aDepartment of Homeland Security $eoversight and coordination of research and development efforts could be strengthened : testimony before the Committee on Homeland Security and Governmental Affairs, U.S. Senate /$fstatement of Dave C. 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July 17, 2013." 320 $aIncludes bibliographical references. 517 $aDepartment of Homeland Security 606 $aResearch and development contracts, Government$zUnited States 606 $aTerrorism$xPrevention$xGovernment policy$zUnited States 615 0$aResearch and development contracts, Government 615 0$aTerrorism$xPrevention$xGovernment policy 700 $aMaurer$b David C.$01388698 712 02$aUnited States.$bCongress.$bSenate.$bCommittee on Homeland Security and Governmental Affairs, 712 02$aUnited States.$bGovernment Accountability Office, 801 0$bGPO 801 1$bGPO 801 2$bOCLCA 801 2$bGPO 906 $aBOOK 912 $a9910704989203321 996 $aDepartment of Homeland Security$93444565 997 $aUNINA LEADER 04538nam 2200721 450 001 9910830699703321 005 20240219134407.0 010 $a1-280-54978-5 010 $a9786610549788 010 $a0-470-00778-8 010 $a0-470-00777-X 024 7 $a10.1002/0470007788 035 $a(CKB)1000000000355779 035 $a(EBL)270454 035 $a(SSID)ssj0000129567 035 $a(PQKBManifestationID)11144133 035 $a(PQKBTitleCode)TC0000129567 035 $a(PQKBWorkID)10078932 035 $a(PQKB)11356148 035 $a(MiAaPQ)EBC270454 035 $a(CaBNVSL)mat05201423 035 $a(IDAMS)0b0000648104a889 035 $a(IEEE)5201423 035 $a(OCoLC)85821071 035 $a(PPN)257263306 035 $a(EXLCZ)991000000000355779 100 $a20151229d2006 uy 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aContamination and ESD control in high technology manufacturing /$fRoger W. Welker, R. Nagarajan, Carl E. Newberg 210 1$aHoboken, New Jersey :$cJohn Wiley & Sons,$dc2006. 210 2$a[Piscataqay, New Jersey] :$cIEEE Xplore,$d[2006] 215 $a1 online resource (516 p.) 300 $aDescription based upon print version of record. 311 $a0-471-41452-2 320 $aIncludes bibliographical references and index. 327 $aFundamentals of contamination control -- Fundamentals of ESD control -- Sampling and analysis methods -- Facilities design : contamination- and ESD-safe work areas -- Getting clean parts and getting parts clean -- Tooling design and certification -- Continuous monitoring -- Consumable supplies and packaging materials -- Controlling contamination and ESD from people -- Layout of change rooms -- Procedures and documentation. 330 $aA practical "how to" guide that effectively deals with the control of both contamination and ESD This book offers effective strategies and techniques for contamination and electrostatic discharge (ESD) control that can be implemented in a wide range of high-technology industries, including semiconductor, disk drive, aerospace, pharmaceutical, medical device, automobile, and food production manufacturing. The authors set forth a new and innovative methodology that can manage both contamination and ESD, often considered to be mutually exclusive challenges requiring distinct strategies. Beginning with two general chapters on the fundamentals of contamination and ESD control, the book presents a logical progression of topics that collectively build the necessary skills and knowledge: . Analysis methods for solving contamination and ESD problems. Building the contamination and ESD control environment, including design and construction of cleanrooms and ESD protected environments. Cleaning processes and the equipment needed to support these processes. Tooling design and certification. Continuous monitoring. Consumable supplies and packaging materials. Controlling contamination and ESD originating from people. Management of cleanrooms and ESD protected workplace environments Contamination and ESD Control in High-Technology Manufacturing conveys a practical, working knowledge of contamination and ESD control strategies and techniques, and it is filled with case studies that illustrate key principles and the benefits of contamination and ESD control. Moreover, its straightforward style makes the material, which integrates many disciplines of engineering and science, clear and accessible. Written by three leading industry experts, this book is an essential guide for engineers and designers across the many industries where contamination and ESD control is a concern. 606 $aElectronic apparatus and appliances$xProtection 606 $aElectric discharges 606 $aElectrostatics 606 $aContamination (Technology) 606 $aClean rooms 615 0$aElectronic apparatus and appliances$xProtection. 615 0$aElectric discharges. 615 0$aElectrostatics. 615 0$aContamination (Technology) 615 0$aClean rooms. 676 $a621.381 676 $a670.42 700 $aWelker$b R. W.$01640787 701 $aNagarajan$b R$g(Ramamurthy)$01640788 701 $aNewberg$b Carl E$01640789 801 0$bCaBNVSL 801 1$bCaBNVSL 801 2$bCaBNVSL 906 $aBOOK 912 $a9910830699703321 996 $aContamination and ESD control in high technology manufacturing$93984497 997 $aUNINA