LEADER 04038nam 2200613Ia 450 001 9910830594403321 005 20230721032405.0 010 $a1-282-37221-1 010 $a9786612372216 010 $a3-527-62193-8 010 $a3-527-62192-X 035 $a(CKB)1000000000520027 035 $a(EBL)481486 035 $a(SSID)ssj0000304209 035 $a(PQKBManifestationID)11226796 035 $a(PQKBTitleCode)TC0000304209 035 $a(PQKBWorkID)10278910 035 $a(PQKB)11336409 035 $a(MiAaPQ)EBC481486 035 $a(OCoLC)232611342 035 $a(EXLCZ)991000000000520027 100 $a20070328d2007 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aNeutrons and synchrotron radiation in engineering materials science$b[electronic resource] $efrom fundamentals to superior materials characterization /$fedited by Walter Reimers ... [et al.] 210 $aWeinheim $cWiley-VCH$d2007 215 $a1 online resource (462 p.) 300 $aDescription based upon print version of record. 311 $a3-527-31533-0 320 $aIncludes bibliographical references and index. 327 $aNeutrons and Synchrotron Radiation in Engineering Materials Science; Contents; Preface; List of Contributors; Part I General; 1 Microstructure and Properties of Engineering Materials; 2 Internal Stresses in Engineering Materials; 3 Texture and Texture Analysis in Engineering Materials; 4 Physical Properties of Photons and Neutrons; 5 Radiation Sources; Part II Methods; 6 Introduction to Diffraction Methods for Internal Stress Analyses; 7 Stress Analysis by Angle-Dispersive Neutron Diffraction; 8 Stress Analysis by Energy-Dispersive Neutron Diffraction 327 $a9 Residual Stress Analysis by Monochromatic High-Energy X-rays10 Residual Stress Analysis by White High Energy X-Rays; 11 Diffraction Imaging for Microstructure Analysis; 12 Basics of Small-Angle Scattering Methods; 13 Small-Angle Neutron Scattering; 14 Decomposition Kinetics in Copper-Cobalt Alloy Systems: Applications of Small-Angle X-ray Scattering; 15 B3 Imaging; 16 Neutron and Synchrotron-Radiation-Based Imaging for Applications in Materials Science - From Macro- to Nanotomography; 17 ?-Tomography of Engineering Materials; 18 Diffraction Enhanced Imaging 327 $aPart III New and Emerging Methods19 3D X-ray Diffraction Microscope; 20 3D Micron-Resolution Laue Diffraction; 21 Quantitative Analysis of Three-Dimensional Plastic Strain Fields Using Markers and X-ray Absorption Tomography; 22 Combined Diffraction and Tomography; Part IV Industrial Applications; 23 Diffraction-Based Residual Stress Analysis Applied to Problems in the Aircraft Industry; 24 Optimization of Residual Stresses in Crankshafts; Index 330 $aBesides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments. 606 $aSynchrotron radiation 606 $aMaterials$xTesting 606 $aMaterials$xAnalysis 606 $aMaterials$xEffect of radiation on 615 0$aSynchrotron radiation. 615 0$aMaterials$xTesting. 615 0$aMaterials$xAnalysis. 615 0$aMaterials$xEffect of radiation on. 676 $a620.11272 701 $aReimers$b W$g(Walter),$f1943-$01667946 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910830594403321 996 $aNeutrons and synchrotron radiation in engineering materials science$94028172 997 $aUNINA