LEADER 00984cam0-2200325---450- 001 990004787520403321 005 20090108114310.0 035 $a000478752 035 $aFED01000478752 035 $a(Aleph)000478752FED01 035 $a000478752 100 $a19990604d1973----km-y0itay50------ba 101 0 $aeng 102 $aUS 105 $a-f--a---001yy 200 1 $a<>literature of Renaissance England$fJohn Hollander, Frank Kermode 210 $aNew York$cOxford University Press$d1973 215 $aXXI, 1092 p., tav.$d22 cm 225 1 $a<>Oxford anthology of english literature$v2 610 0 $aLetteratura inglese$aSec.15.-16.$aAntologie 676 $a820.8 702 1$aHollander,$bJohn 702 1$aKermode,$bFrank$f<1919-2010> 801 0$aIT$bUNINA$c20070214$gRICA$2UNIMARC 901 $aBK 912 $a990004787520403321 952 $a820.8 HOL 1$fFLFBC 959 $aFLFBC 996 $aLiterature of Renaissance England$9561300 997 $aUNINA LEADER 01261nam0-2200313---450- 001 990009919540403321 005 20141202120152.0 035 $a000991954 035 $aFED01000991954 035 $a(Aleph)000991954FED01 035 $a000991954 100 $a20141125d1953----km-y0itay50------ba 101 0 $aita 102 $aIT 105 $ay-------001yy 200 1 $a<>investimenti nel Mezzogiorno in funzione dell' economia nazionale$erelazione al Convegno per i problemi economici liguri, Savona 7-8 marzo 1953$fGiuseppe Orcel 210 $a[S.l.$cs.n.]$d1953$eRoma$gA.BE.T.E. Tip. 215 $a35 p.$d25 cm 225 1 $aCassa per opere straordinarie di pubblico interesse nell'Italia meridionale (Cassa per il Mezzogiorno), Centro studi$iQuaderni$v12 300 $aIn testa al front.: Cassa per opere straordinarie di pubblico interesse nell'Italia meridionale ( Cassa per il Mezzogiorno), Centro studi 610 0 $aItalia meridionale$aInterventi statali 700 1$aOrcel,$bGiuseppe$0524156 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990009919540403321 952 $aU 4/32$bs.i.$fDINGE 959 $aDINGE 996 $aInvestimenti nel Mezzogiorno in funzione dell' economia nazionale$9830705 997 $aUNINA LEADER 01325nam--2200409---450- 001 990002199250203316 005 20091214102350.0 035 $a000219925 035 $aUSA01000219925 035 $a(ALEPH)000219925USA01 035 $a000219925 100 $a20041122d1983----km-y0itay0103----ba 101 $aita 102 $aIT 105 $a||||||||001yy 200 1 $a<> potere della beneficenza$eil patrimonio delle ex opere pie$fPiercarlo Grimaldi, Renato Grimaldi$gpresentazione di Luciano Gallino 210 $aMilano$cF. Angeli$dc1983 215 $a209 p.$cill.$d22 cm 225 2 $aSociologia$v66 410 0$12001$aSociologia$v66 454 1$12001 461 1$1001-------$12001 607 0 $aTorino$xIstituti di assistenza$xAssistenza 676 $a362 700 1$aGRIMALDI,$bPiercarlo$0144065 701 1$aGRIMALDI,$bRenato$0120193 702 1$aGALLINO,$bLuciano$f<1927- > 801 0$aIT$bsalbc$gISBD 912 $a990002199250203316 951 $aXXX.B. Coll. 63/ 22 (Coll. CJ (66))$b8090 E.C.$cXXX.B. Coll. 63/ 22 (Coll. CJ)$d00261663 959 $aBK 969 $aECO 979 $aSIAV7$b10$c20041122$lUSA01$h1445 979 $aRSIAV2$b90$c20091214$lUSA01$h1023 979 $aANNAMARIA$b90$c20120516$lUSA01$h1416 996 $aPotere della beneficenza$9617159 997 $aUNISA LEADER 01832nam a22003491i 4500 001 991001049499707536 005 20040315102815.0 008 040318m19801987it |||||||||||||||||ita 035 $ab12710386-39ule_inst 035 $aARCHE-069464$9ExL 040 $aDip.to Filosofia$bita$cA.t.i. Arché s.c.r.l. Pandora Sicilia s.r.l. 082 04$a349.45 245 00$aAppendice /$c[a cura della redazione giuridica della UTET ; sotto la direzione di Dante Scarella] 260 $aTorino :$bUTET,$cc1980-1987 300 $a7 v. ;$c31 cm 440 0$aNovissimo digesto italiano 650 4$aDiritto$zItalia$xEnciclopedie e dizionari 700 1 $aScarella, Dante 700 1 $aAzara, Antonio 700 1 $aEula, Ernesto 907 $a.b12710386$b02-04-14$c31-03-04 912 $a991001049499707536 945 $aLE005 DIR IV A 57 APP. v. 1$cV. 1$g1$i2005000155871$lle005$o-$pE0.00$q-$rl$s- $t0$u0$v0$w0$x0$y.i13233658$z31-03-04 945 $aLE005 DIR IV A 57 APP. v. 2$cV. 2$g1$i2005000156069$lle005$o-$pE0.00$q-$rl$s- $t0$u0$v0$w0$x0$y.i1323366x$z31-03-04 945 $aLE005 DIR IV A 57 APP. v. 3$cV. 3$g1$i2005000155888$lle005$o-$pE0.00$q-$rl$s- $t0$u0$v0$w0$x0$y.i13233671$z31-03-04 945 $aLE005 DIR IV A 57 APP. v. 4$cV. 4$g1$i2005000156076$lle005$o-$pE0.00$q-$rl$s- $t0$u0$v0$w0$x0$y.i13233683$z31-03-04 945 $aLE005 DIR IV A 57 APP. v. 5$cV. 5$g1$i2005000155963$lle005$o-$pE0.00$q-$rl$s- $t0$u0$v0$w0$x0$y.i13233695$z31-03-04 945 $aLE005 DIR IV A 57 APP. v. 6$cV. 6$g1$i2005000155949$lle005$o-$pE0.00$q-$rl$s- $t0$u0$v0$w0$x0$y.i13233701$z31-03-04 945 $aLE005 DIR IV A 57 APP. v. 7$cV. 7$g1$i2005000155864$lle005$o-$pE0.00$q-$rl$s- $t0$u0$v0$w0$x0$y.i13233713$z31-03-04 996 $aAppendice$972237 997 $aUNISALENTO 998 $ale005$b31-03-04$cm$da $e-$fita$git $h0$i7 LEADER 05603nam 2200685 a 450 001 9910830439703321 005 20170816123757.0 010 $a1-118-60275-7 010 $a1-118-60276-5 010 $a1-118-60280-3 035 $a(CKB)2670000000336696 035 $a(EBL)1124672 035 $a(SSID)ssj0000831910 035 $a(PQKBManifestationID)11462092 035 $a(PQKBTitleCode)TC0000831910 035 $a(PQKBWorkID)10881243 035 $a(PQKB)10854713 035 $a(MiAaPQ)EBC1124672 035 $a(CaSebORM)9781118602805 035 $a(OCoLC)828424625 035 $a(EXLCZ)992670000000336696 100 $a20110916d2011 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aFerroelectric dielectrics integrated on silicon$b[electronic resource] /$fedited by Emmanuel Defay 205 $a1st edition 210 $aLondon $cISTE Ltd. ;$aHoboken, N.J. $cJohn Wiley$d2011 215 $a1 online resource (464 p.) 225 1 $aISTE 300 $aAdapted and updated from: Dielectriques ferroelectriques integres sur silicium, published in France by Hermes Science/Lavoisier, 2011. 311 $a1-84821-313-1 320 $aIncludes bibliographical references and index. 327 $aCover; Title Page; Copyright Page; Table of Contents; Preface; Chapter 1. The Thermodynamic Approach; 1.1. Background; 1.2. The functions of state; 1.3. Linear equations, piezoelectricity; 1.4. Nonlinear equations, electrostriction; 1.5. Thermodynamic modeling of the ferroelectric-paraelectricphase transition; 1.5.1. Assumption on the elastic Gibbs energy; 1.5.2. Second-order transition; 1.5.3. Effect of stress; 1.5.4. First-order transition; 1.6. Conclusion; 1.7. Bibliography; Chapter 2. Stress Effect on Thin Films; 2.1. Introduction; 2.2. Modeling the system under consideration 327 $a2.3. Temperature-misfit strain phase diagrams for monodomain films2.3.1. Phase diagram construction from the Landau-Ginzburg-Devonshire theory; 2.3.2. Calculations limitations; 2.4. Domain stability map; 2.4.1. Presentation and description of the framework of study; 2.4.2. Main contributions to the total energy of a film; 2.4.3. Influence of thickness; 2.4.4. Macroscopic elastic energy for each type of tetragonal domain; 2.4.5. Indirect interaction energy; 2.4.6. Domain structures at equilibrium; 2.4.7. Domain stability map; 2.5. Temperature-misfit strain phase diagram for polydomain films 327 $a2.6. Discussion of the nature of the "misfit strain"2.6.1. Mechanical misfit strain; 2.6.2. Thermodynamic misfit strain; 2.6.3. As an illustration; 2.7. Conclusion; 2.8. Experimental validation of phase diagrams: state of the art; 2.9. Case study; 2.10. Results; 2.10.1. Evolution of the lattice parameters; 2.10.2. Associated stresses and strains; 2.11. Comparison between the experimental data and the temperature-misfit strain phase diagrams; 2.11.1. Thin film of PZT; 2.11.2. Thin layer of PbTiO3; 2.12. Conclusion; 2.13. Bibliography; Chapter 3. Deposition and Patterning Technologies 327 $a3.1. Deposition method3.1.1. Cathodic sputtering; 3.1.2. Ion beam sputtering; 3.1.3. Pulsed laser deposition; 3.1.4. The sol-gel process; 3.1.5. The MOCVD; 3.1.6. Molecular beam epitaxy; 3.2. Etching; 3.2.1. Wet etching; 3.2.2. Dry etching; 3.3. Contamination; 3.4. Monocrystalline thin-film transfer; 3.4.1. Smart CutTM technology; 3.4.2. Bonding/thinning; 3.4.3. Interest in the material in a thin layer; 3.4.4. State of the art of the domain/applications; 3.4.5. An exemplary implementation; 3.5. Design of experiments; 3.5.1. The assumptions; 3.5.2. Reproducibility 327 $a3.5.3. How can we reduce the number of experiments?3.5.4. A DOE example: PZT RF magnetron sputtering deposition; 3.6. Conclusion; 3.7. Bibliography; Chapter 4. Analysis Through X-ray Diffraction of Polycrystalline Thin Films; 4.1. Introduction; 4.2. Some reminders of X-ray diffraction and crystallography; 4.2.1. Nature of X-rays; 4.2.2. X-ray scattering and diffraction; 4.3. Application to powder or polycrystalline thin-films; 4.4. Phase analysis by X-ray diffraction; 4.4.1. Grazing incidence diffraction; 4.4.2. De-texturing; 4.4.3. Quantitative analysis 327 $a4.5. Identification of coherent domain sizes of diffraction and micro-strains 330 $aThis book describes up-to-date technology applied to high-K materials for More Than Moore applications, i.e. microsystems applied to microelectronics core technologies.After detailing the basic thermodynamic theory applied to high-K dielectrics thin films including extrinsic effects, this book emphasizes the specificity of thin films. Deposition and patterning technologies are then presented. A whole chapter is dedicated to the major role played in the field by X-Ray Diffraction characterization, and other characterization techniques are also described such as Radio frequency characterizat 410 0$aISTE 606 $aFerroelectric thin films 606 $aSilicon$xElectric properties 606 $aElectric batteries$xCorrosion 615 0$aFerroelectric thin films. 615 0$aSilicon$xElectric properties. 615 0$aElectric batteries$xCorrosion. 676 $a621.3815/2 676 $a621.38152 700 $aDefa˙$b Emmanuel$0863199 701 $aDefay?$b Emmanuel$0863199 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910830439703321 996 $aFerroelectric dielectrics integrated on silicon$94084710 997 $aUNINA