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010   $a9786610367993
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010   $a0-471-64468-4
010   $a0-471-64465-X
024 7 $a10.1002/047164465X
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100   $a20151221d2004      uy              
101 0 $aeng
135   $aurcn|||||||||
181   $ctxt
182   $cc
183   $acr
200 10$aTesting for EMC compliance $eapproaches and techniques /$fMark I. Montrose, Edward M. Nakauchi
210  1$aHoboken, New Jersey :$cJohn Wiley,$d2004.
210  2$a[Piscataqay, New Jersey] :$cIEEE Xplore,$d[2004]
215   $a1 online resource (480 p.)
300   $aDescription based upon print version of record.
311   $a0-471-43308-X 
320   $aIncludes bibliographical references (p. 447-451) and index.
327   $a1. Introduction. -- 2. Electric, Magnetic, and Static Fields. -- 3. Instrumentation. -- 4. Test Facilities. -- 5. Probes, Antennas, and Support Equipment. -- 6. Conducted Testing. -- 7. Radiated Testing. -- 8. General Approaches Troubleshooting. -- 9. On-Site Troubleshooting Techniques. -- Appendix A: Building Probes. -- Appendix B: Test Procedures. -- Glossary. -- Bibliography. -- Index. -- About the Authors. 
330   $aThe Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become boring after a few pages. This text tells engineers what to do and how to do it. Only a basic knowledge of math, electronics, and a basic understanding of EMI/EMC are necessary to understand the concepts and circuits described. Once EMC troubleshooting is demystified, readers learn there are quick and simple techniques to solve complicated problems a key aspect of this book. Simple and inexpensive methods to resolve EMI issues are discussed to help generate unique ideas and methods for developing additional diagnostic tools and measurement procedures. An appendix on how to build probes is included. It can be a fun activity, even humorous at times with bizarre techniques (i.e., the sticky finger probe).
606   $aElectromagnetic compatibility
606   $aElectromagnetic interference
615  0$aElectromagnetic compatibility.
615  0$aElectromagnetic interference.
676   $a621.382
676   $a621.382/24
676   $a621.38224
700   $aMontrose$b Mark I.$028377
701   $aNakauchi$b Edward M$01615742
801  0$bCaBNVSL
801  1$bCaBNVSL
801  2$bCaBNVSL
906   $aBOOK
912   $a9910830329203321
996   $aTesting for EMC compliance$93946075
997   $aUNINA