LEADER 03985nam 22006014a 450 001 9910830201903321 005 20230617031403.0 010 $a1-280-23888-7 010 $a9786610238880 010 $a0-470-02042-3 010 $a0-470-02043-1 035 $a(CKB)1000000000019105 035 $a(EBL)239004 035 $a(SSID)ssj0000275608 035 $a(PQKBManifestationID)11233649 035 $a(PQKBTitleCode)TC0000275608 035 $a(PQKBWorkID)10218622 035 $a(PQKB)11771624 035 $a(MiAaPQ)EBC239004 035 $a(OCoLC)225918250 035 $a(EXLCZ)991000000000019105 100 $a20030724d2004 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aX-ray spectrometry$b[electronic resource] $erecent technological advances /$fedited by Kouichi Tsuji, Jasna Injuk, Rene? Van Grieken 210 $aChichester, West Sussex, England ;$aHoboken, NJ, USA $cWiley$dc2004 215 $a1 online resource (617 p.) 300 $aDescription based upon print version of record. 311 $a0-471-48640-X 320 $aIncludes bibliographical references and index. 327 $aX-Ray Spectrometry: Recent Technological Advances; Contents; Contributors; Preface; 1 Introduction; 1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume; 2 X-Ray Sources; 2.1 Micro X-ray Sources; 2.2 New Synchrotron Radiation Sources; 2.3 Laser-driven X-ray Sources; 3 X-Ray Optics; 3.1 Multilayers for Soft and Hard X-rays; 3.2 Single Capillaries X-ray Optics; 3.3 Polycapillary X-ray Optics; 3.4 Parabolic Compound Refractive X-ray Lenses; 4 X-Ray Detectors; 4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy 327 $a4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry4.3 Superconducting Tunnel Junctions; 4.4 Cryogenic Microcalorimeters; 4.5 Position Sensitive Semiconductor Strip Detectors; 5 Special Configurations; 5.1 Grazing-incidence X-ray Spectrometry; 5.2 Grazing-exit X-ray Spectrometry; 5.3 Portable Equipment for X-ray Fluorescence Analysis; 5.4 Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis; 5.5 High-energy X-ray Fluorescence; 5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy 327 $a5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy5.8 X-Ray Absorption Techniques; 6 New Computerisation Methods; 6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy; 6.2 Spectrum Evaluation; 7 New Applications; 7.1 X-Ray Fluorescence Analysis in Medical Sciences; 7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films; 7.3 X-Ray Spectrometry in Archaeometry; 7.4 X-Ray Spectrometry in Forensic Research; 7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry 327 $aIndex 330 $aX-Ray Spectrometry: Recent Technological Advances covers the latest developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry. Includes the most advanced and high-tech aspects of the chemical analysis techniques based on x-raysIntroduces new types of X-ray optics and X-ray detectors, covering history, principles, characteristics and future trendsWritten by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fieldsSections include: X-Ray Sources, X-Ray Optics, X-Ray Detectors, Spec 606 $aX-ray spectroscopy 615 0$aX-ray spectroscopy. 676 $a543.08586 676 $a543.62 676 $a543/.62 701 $aTsuji$b Kouichi$01699927 701 $aInjuk$b Jasna$01699928 701 $aGrieken$b R. van$g(Rene?)$0435061 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910830201903321 996 $aX-ray spectrometry$94082554 997 $aUNINA