LEADER 02407nam 22006011 450 001 9910827964703321 005 20240405122511.0 010 $a3-03813-148-2 035 $a(CKB)3710000000025521 035 $a(EBL)1869136 035 $a(SSID)ssj0001127796 035 $a(PQKBManifestationID)11634362 035 $a(PQKBTitleCode)TC0001127796 035 $a(PQKBWorkID)11152749 035 $a(PQKB)10457050 035 $a(MiAaPQ)EBC1869136 035 $a(Au-PeEL)EBL1869136 035 $a(CaPaEBR)ebr10777855 035 $a(OCoLC)860712680 035 $a(EXLCZ)993710000000025521 100 $a20070910d2007 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aHgCDTe system $ereference guide /$fD. J. Fisher, editor 205 $a1st ed. 210 1$aStafa-Zuerich, Switzerland :$cTTP, Trans Tech Publications,$d[2007] 210 4$dİ2007 215 $a1 online resource (201 p.) 225 1 $aDefects and diffusion forum,$x1012-0386 ;$vv. 267 300 $aDescription based upon print version of record. 311 $a3-908451-44-2 320 $aIncludes bibliographical references and indexes. 327 $aHgCdTe System - Reference Guide; Table of Contents; Abstracts 330 $aThis system, consisting of compositions lying between the end-members, CdTe and HgTe, constitutes perhaps the third most important semiconductor after Si and GaAs. Its importance stems from the ability to tailor the band-gap precisely between that (1.5eV) of the semiconductor, CdTe, and the zero value of the semi-metal, HgTe; giving, in particular, one of the most versatile infra-red detectors known. The intermediate compositions also benefit from the usual mechanisms which improve the mechanical properties of alloys. As an aid to those working on this system, this volume summarizes known diff 410 0$aDiffusion and defect data.$nPt. A,$pDefect and diffusion forum ;$vv. 267. 606 $aPhysical metallurgy 606 $aDiffusion 606 $aSolids$xDefects 615 0$aPhysical metallurgy. 615 0$aDiffusion. 615 0$aSolids$xDefects. 676 $a669.95 701 $aFisher$b D. J$0727312 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910827964703321 996 $aHgCDTe system$94038112 997 $aUNINA