LEADER 03463nam 2200517 450 001 9910478941103321 005 20180416175515.0 010 $a90-04-35988-5 024 7 $a10.1163/9789004359888 035 $a(CKB)4100000001400687 035 $a(MiAaPQ)EBC5265056 035 $a(DLC) 2018017204 035 $a(OCoLC)1006611228 035 $a(nllekb)BRILL9789004359888 035 $a(EXLCZ)994100000001400687 100 $a20180303h20182018 uy 0 101 0 $aeng 135 $aurcnu|||||||| 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 00$aMarxism and sociology $ea selection of writings by Kazimierz Kelles-Krauz /$fedited by Helena Chmielewska-Szlajfer ; essays translated by Jonathan Weber 210 1$aLeiden, Netherlands ;$aBoston, [Massachusetts] :$cBrill,$d2018. 210 4$d©2018 215 $a1 online resource (261 pages) 225 1 $aStudies in Critical Social Sciences,$x1573-4234 ;$vVolume 119 311 $a90-04-29708-1 320 $aIncludes bibliographical references and indexes. 327 $tFront Matter -- $tContents -- $tAcknowledgements -- $tA Revised Introduction to the English Edition: Kazimierz Kelles-Krauz?s Theory, Practice, and Purposeless Change /$rHelena Chmielewska-Szlajfer -- $tThe Sociological Law of Retrospection: The Law of Revolutionary Retrospection as a Consequence of Economic Materialism1,2 -- $tThe Golden Age, State of Nature, and Development in Contradictions: From Studies into the Sources of Marxism1 -- $tComtism and Marxism: Positivism and the Monistic Comprehension of History1 -- $tA Glance at the Development of Sociology in the 19th Century1 -- $tThe Crisis of Marxism: On the So-Called ?Crisis of Marxism?1,2 -- $tWhat is Economic Materialism?1 -- $tA Few Main Principles in the Development of Art1 -- $tPsychiatry and the Science of Ideas1 -- $tThe Social Dialectic in Vico?s Philosophy1,2. 330 $aKazimierz Kelles-Krauz was an extraordinary figure on the Polish political scene at the turn of the 20th century. A Marxist and patriot, academic and politician, Kelles-Krauz was most known for his efforts to reconcile the needs of the nation with international socialism. This volume, however, offers a selection of his writings centred on the history of ideas, published for the first time in English. Kelles-Krauz?s works, while Marxist at heart, linked ideas stemming from the concepts of German idealists, French positivists, as well as contemporary sociologists who offered a bridge between research on individuals and the workings of social systems. Kelles-Krauz, however, repeatedly transcended Marxist tenets, focusing on the construction of traditions, social norms, and the social role of art. This edited volume was first published in Polish as Kazimierz Kelles-Krauz: Marksizm a socjologia. Wybór pism by Wydawnictwa Uniwersytetu Warszawskiego in 2014. This current work has been revised and translated into English. 410 0$aStudies in critical social sciences ;$vVolume 119. 606 $aSociology 606 $aSocialism 608 $aElectronic books. 615 0$aSociology. 615 0$aSocialism. 676 $a335.092 702 $aChmielewska-Szlajfer$b Helena 702 $aWeber$b Jonathan 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910478941103321 996 $aMarxism and sociology$92087521 997 $aUNINA LEADER 04070nam 2200565 450 001 9910826934903321 005 20230125191104.0 010 $a1-60650-682-X 035 $a(CKB)3710000000452436 035 $a(EBL)2095627 035 $a(SSID)ssj0001561340 035 $a(PQKBManifestationID)16200281 035 $a(PQKBTitleCode)TC0001561340 035 $a(PQKBWorkID)14829686 035 $a(PQKB)11211561 035 $a(OCoLC)914432297 035 $a(CaBNvSL)swl00405296 035 $a(MiAaPQ)EBC2095627 035 $a(Au-PeEL)EBL2095627 035 $a(CaPaEBR)ebr11078099 035 $a(CaONFJC)MIL813360 035 $a(EXLCZ)993710000000452436 100 $a20181229d2015 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aAuger electron spectroscopy $epractical application to materials analysis and characterization of surfaces, interfaces, and thin films /$fJohn Wolstenholme 210 1$aNew York, New York :$cMomentum Press, LLC,$d[2015] 210 4$d©2015 215 $a1 online resource (256 p.) 225 1 $aMaterials characterization and analysis collection 300 $aDescription based upon print version of record. 311 $a1-60650-681-1 320 $aIncludes bibliographical references and index. 327 $a1. Introduction -- 2. The interaction of electrons with solid materials -- 3. AES methodologies -- 4. Instrumentation for auger analysis -- 5. Auger electron spectroscopy in materials analysis -- 6. Analytical methods for the characterization of materials -- Appendix 1. Abbreviations and acronyms -- Appendix 2. Quantum numbers -- Appendix 3. Comparison of surface and thin film analysis techniques -- Appendix 4. Standardization in surface analysis -- Appendix 5. Sources of the figures -- Further reading -- Index. 330 3 $aAuger electron spectroscopy (AES) is capable of providing elemental composition and, in some restricted cases, chemical bonding information for the elements present near the surface of solid materials. The surface specificity of this technique is such that only atoms in the top 5 to 10 nm are detected. The great strength of AES is its ability to provide this information with excellent spatial resolution (down to <10 nm). It can be used to provide elemental maps of the surface, which gives rise to the term scanning Auger microscopy (SAM). When used in combination with a source of high-energy ions, it provides elemental depth profiles to depths of up to a few micrometers. The use of AES and SAM for the characterization of a wide range of technological materials is discussed. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high- resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, and X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed. 410 0$aMaterials characterization and analysis collection. 606 $aElectron spectroscopy 615 0$aElectron spectroscopy. 676 $a543.0858 700 $aWolstenholme$b John$01717217 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910826934903321 996 $aAuger electron spectroscopy$94113179 997 $aUNINA