LEADER 04070nam 2200565 450 001 9910826934903321 005 20230125191104.0 010 $a1-60650-682-X 035 $a(CKB)3710000000452436 035 $a(EBL)2095627 035 $a(SSID)ssj0001561340 035 $a(PQKBManifestationID)16200281 035 $a(PQKBTitleCode)TC0001561340 035 $a(PQKBWorkID)14829686 035 $a(PQKB)11211561 035 $a(OCoLC)914432297 035 $a(CaBNvSL)swl00405296 035 $a(MiAaPQ)EBC2095627 035 $a(Au-PeEL)EBL2095627 035 $a(CaPaEBR)ebr11078099 035 $a(CaONFJC)MIL813360 035 $a(EXLCZ)993710000000452436 100 $a20181229d2015 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aAuger electron spectroscopy $epractical application to materials analysis and characterization of surfaces, interfaces, and thin films /$fJohn Wolstenholme 210 1$aNew York, New York :$cMomentum Press, LLC,$d[2015] 210 4$dİ2015 215 $a1 online resource (256 p.) 225 1 $aMaterials characterization and analysis collection 300 $aDescription based upon print version of record. 311 $a1-60650-681-1 320 $aIncludes bibliographical references and index. 327 $a1. Introduction -- 2. The interaction of electrons with solid materials -- 3. AES methodologies -- 4. Instrumentation for auger analysis -- 5. Auger electron spectroscopy in materials analysis -- 6. Analytical methods for the characterization of materials -- Appendix 1. Abbreviations and acronyms -- Appendix 2. Quantum numbers -- Appendix 3. Comparison of surface and thin film analysis techniques -- Appendix 4. Standardization in surface analysis -- Appendix 5. Sources of the figures -- Further reading -- Index. 330 3 $aAuger electron spectroscopy (AES) is capable of providing elemental composition and, in some restricted cases, chemical bonding information for the elements present near the surface of solid materials. The surface specificity of this technique is such that only atoms in the top 5 to 10 nm are detected. The great strength of AES is its ability to provide this information with excellent spatial resolution (down to <10 nm). It can be used to provide elemental maps of the surface, which gives rise to the term scanning Auger microscopy (SAM). When used in combination with a source of high-energy ions, it provides elemental depth profiles to depths of up to a few micrometers. The use of AES and SAM for the characterization of a wide range of technological materials is discussed. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high- resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, and X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed. 410 0$aMaterials characterization and analysis collection. 606 $aElectron spectroscopy 615 0$aElectron spectroscopy. 676 $a543.0858 700 $aWolstenholme$b John$01717217 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910826934903321 996 $aAuger electron spectroscopy$94113179 997 $aUNINA