LEADER 02608nam 2200709 a 450 001 9910824874103321 005 20240516091620.0 010 $a9786613379498 010 $a9783527639557 010 $a3527639551 010 $a9781283379496 010 $a128337949X 010 $a9783527639540 010 $a3527639543 010 $a9783527639564 010 $a352763956X 035 $a(CKB)2670000000133405 035 $a(EBL)827027 035 $a(OCoLC)773301844 035 $a(SSID)ssj0000638427 035 $a(PQKBManifestationID)11432337 035 $a(PQKBTitleCode)TC0000638427 035 $a(PQKBWorkID)10714451 035 $a(PQKB)10985625 035 $a(OCoLC)771282798 035 $a(MiAaPQ)EBC827027 035 $a(Au-PeEL)EBL827027 035 $a(CaPaEBR)ebr10521342 035 $a(CaONFJC)MIL337949 035 $a(Perlego)1011954 035 $a(EXLCZ)992670000000133405 100 $a20120109d2011 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aMechanical stress on the nanoscale $esimulation, material systems and characterization techniques /$fedited by Margrit Hanbu?cken, Pierre Mu?ller, and Ralf B. Wehrspohn 205 $a1st ed. 210 $aWeinheim, Germany $cWiley-VCH$d2011 215 $a1 online resource (382 p.) 300 $aDescription based upon print version of record. 311 08$a9783527410668 311 08$a352741066X 320 $aIncludes bibliographical references and index. 327 $apt. 1. Fundamentals of stress and strain on the nanoscale -- pt. 2. Model systems with stress-engineered properties -- pt. 3. Characterization techniques of measuring stresses on the nanoscale. 330 $aBringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques. Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics. 606 $aNanoscience 606 $aMechanics 615 0$aNanoscience. 615 0$aMechanics. 676 $a620.115 701 $aHanbu?cken$b Margrit$01680313 701 $aMu?ller$b Pierre$0663455 701 $aWehrspohn$b Ralf B$01680314 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910824874103321 996 $aMechanical stress on the nanoscale$94048973 997 $aUNINA