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001 9910822899203321
005 20200520144314.0
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100   $a20040608d2004      uy         0
101 0 $aeng
135   $aur|n|---|||||
181   $ctxt
182   $cc
183   $acr
200 10$aX-ray and electron diffraction studies in materials science /$fD.J. Dyson
205   $a1st ed.
210   $aLondon $cManey for the Institute of Materials, Minerals, and Mining$dc2004
215   $a1 online resource (376 p.)
300   $aDescription based upon print version of record.
311   $a1-902653-74-2 
320   $aIncludes bibliographical references and index.
327   $aContents; INDEX; Foreword; REAL SPACE; CRYSTAL CHEMISTRY; THE INTENSITY OF DIFFRACTION; THE STEREOGRAPHIC PROJECTION; INSTRUMENT CONSIDERATIONS; LINE PROFILES; dS AND IS - PHASE IDENTIFICATION; QUANTITATIVE ANALYSIS; CRYSTALLITE SIZE ANALYSIS; THIN LAYERS; CRYSTALLOGRAPHIC TEXTURE; ELECTRON DIFFRACTION AND ITS RELATION TO XRD; APPENDIX - lA; APPENDIX - IB
330   $aX-ray diffraction was first applied almost a century ago. The subsequent development of the technique and its application across industry and academia to physical, chemical and biological problems has made it an important tool in the armoury of the analyst. Much of he early work developed the basic theory and much of this is still relevant today. These early years saw the publication of some extremely good texts on the subject. Much of what is presented in these is still applicable; many of them however are no longer in print. More recent times have seen the emergence of diffractometry an cont
606   $aElectrons$xDiffraction
606   $aX-rays
606   $aCrystallography
615  0$aElectrons$xDiffraction.
615  0$aX-rays.
615  0$aCrystallography.
676   $a548/.83
700   $aDyson$b D. J$g(David John)$019732
712 02$aInstitute of Materials, Minerals, and Mining.
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910822899203321
996   $aX-ray and electron diffraction studies in materials science$93963583
997   $aUNINA