LEADER 05509nam 2200685 450 001 9910822150203321 005 20230807212314.0 010 $a1-118-98595-8 010 $a1-118-98587-7 035 $a(CKB)3710000000315822 035 $a(EBL)1891003 035 $a(SSID)ssj0001440817 035 $a(PQKBManifestationID)11759727 035 $a(PQKBTitleCode)TC0001440817 035 $a(PQKBWorkID)11392354 035 $a(PQKB)10786128 035 $a(MiAaPQ)EBC1891003 035 $a(Au-PeEL)EBL1891003 035 $a(CaPaEBR)ebr10997811 035 $a(OCoLC)896908440 035 $a(EXLCZ)993710000000315822 100 $a20150106h20152015 uy 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt 182 $cc 183 $acr 200 10$aTotal-reflection x-ray fluorescence analysis and related methods /$fReinhold Klockenka?mper, Alex von Bohlen 205 $a2nd ed. 210 1$aHoboken, New Jersey :$cWiley,$d2015. 210 4$d©2015 215 $a1 online resource (555 p.) 225 1 $aChemical Analysis 300 $aDescription based upon print version of record. 311 $a1-118-46027-8 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $aTotal-Reflection X-ray Fluorescence Analysis and Related Methods; Contents; Foreword; Acknowledgments; List of Acronyms; List of Physical Units and Subunits; List of Symbols; Chapter 1: Fundamentals of X-Ray Fluorescence; 1.1 A Short History of XRF; 1.2 The New Variant TXRF; 1.2.1 Retrospect on its Development; 1.2.2 Relationship of XRF and TXRF; 1.3 Nature and Production of X-Rays; 1.3.1 The Nature of X-Rays; 1.3.2 X-Ray Tubes as X-Ray Sources; 1.3.2.1 The Line Spectrum; 1.3.2.2 The Continuous Spectrum; 1.3.3 Polarization of X-Rays; 1.3.4 Synchrotron Radiation as X-Ray Source 327 $a1.3.4.1 Electrons in Fields of Bending Magnets 1.3.4.2 Radiation Power of a Single Electron; 1.3.4.3 Angular and Spectral Distribution of SR; 1.3.4.4 Comparison with Black-Body Radiation; 1.4 Attenuation of X-Rays; 1.4.1 Photoelectric Absorption; 1.4.2 X-Ray Scatter; 1.4.3 Total Attenuation; 1.5 Deflection of X-Rays; 1.5.1 Reflection and Refraction; 1.5.2 Diffraction and Bragg's Law; 1.5.3 Total External Reflection; 1.5.3.1 Reflectivity; 1.5.3.2 Penetration Depth; 1.5.4 Refraction and Dispersion; References; Chapter 2: Principles of Total Reflection XRF; 2.1 Interference of X-Rays 327 $a2.1.1 Double-Beam Interference 2.1.2 Multiple-Beam Interference; 2.2 X-Ray Standing Wave Fields; 2.2.1 Standing Waves in Front of a Thick Substrate; 2.2.2 Standing Wave Fields Within a Thin Layer; 2.2.3 Standing Waves Within a Multilayer or Crystal; 2.3 Intensity of Fluorescence Signals; 2.3.1 Infinitely Thick and Flat Substrates; 2.3.2 Granular Residues on a Substrate; 2.3.3 Buried Layers in a Substrate; 2.3.4 Reflecting Layers on Substrates; 2.3.5 Periodic Multilayers and Crystals; 2.4 Formalism for Intensity Calculations; 2.4.1 A Thick and Flat Substrate 327 $a2.4.2 A Thin Homogeneous Layer on a Substrate 2.4.3 A Stratified Medium of Several Layers; References; Chapter 3: Instrumentation for TXRF and GI-XRF; 3.1 Basic Instrumental Setup; 3.2 High and Low-Power X-Ray Sources; 3.2.1 Fine-Focus X-Ray Tubes; 3.2.2 Rotating Anode Tubes; 3.2.3 Air-Cooled X-Ray Tubes; 3.3 Synchrotron Facilities; 3.3.1 Basic Setup with Bending Magnets; 3.3.2 Undulators, Wigglers, and FELs; 3.3.3 Facilities Worldwide; 3.4 The Beam Adapting Unit; 3.4.1 Low-Pass Filters; 3.4.2 Simple Monochromators; 3.4.3 Double-Crystal Monochromators; 3.5 Sample Positioning 327 $a3.5.1 Sample Carriers 3.5.2 Fixed Angle Adjustment for TXRF ("Angle Cut"); 3.5.3 Stepwise-Angle Variation for GI-XRF ("Angle Scan"); 3.6 Energy-Dispersive Detection of X-Rays; 3.6.1 The Semiconductor Detector; 3.6.2 The Silicon Drift Detector; 3.6.3 Position Sensitive Detectors; 3.7 Wavelength-Dispersive Detection of X-Rays; 3.7.1 Dispersing Crystals with Soller Collimators; 3.7.2 Gas-Filled Detectors; 3.7.3 Scintillation Detectors; 3.8 Spectra Registration and Evaluation; 3.8.1 The Registration Unit; 3.8.2 Performance Characteristics; 3.8.2.1 Detector Efficiency; 3.8.2.2 Spectral Resolution 327 $a3.8.2.3 Input-Output Yield 330 $aProviding an accessible introduction into the use of Total-Reflection X-ray Fluorescence (TXRF) Analysis, both from a theoretical point of view and for practical applications, this new edition of Total-Reflection X-Ray Fluorescence Analysis is completely updated and enlarged to emphasize new methods and techniques. Written to enable students and scientists to evaluate the suitability of a TXRF method for their specific needs, the text provides an overview to the physical fundamentals and principles of Total-Reflection X-ray Fluorescence (TXRF) Analysis, explains instrumentation and setups, and 410 0$aChemical analysis. 606 $aFluorescence spectroscopy 606 $aX-ray spectroscopy 606 $aReflectance spectroscopy 615 0$aFluorescence spectroscopy. 615 0$aX-ray spectroscopy. 615 0$aReflectance spectroscopy. 676 $a543.56 700 $aReinhold Klockenka?mper$01629252 702 $aBohlen$b Alex von 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910822150203321 996 $aTotal-reflection x-ray fluorescence analysis and related methods$93966875 997 $aUNINA LEADER 05532oam 2201093 c 450 001 9910372799903321 005 20260202090927.0 010 $a9783839406816 010 $a3839406811 024 7 $a10.14361/9783839406816 035 $a(CKB)3710000000482714 035 $a(OAPEN)1007459 035 $a(DE-B1597)461529 035 $a(OCoLC)1002274268 035 $a(OCoLC)1004882377 035 $a(OCoLC)1011454080 035 $a(OCoLC)1013939938 035 $a(OCoLC)979892092 035 $a(OCoLC)980172647 035 $a(OCoLC)987938900 035 $a(OCoLC)992489849 035 $a(OCoLC)999360731 035 $a(DE-B1597)9783839406816 035 $a(MiAaPQ)EBC5494248 035 $a(Au-PeEL)EBL5494248 035 $a(OCoLC)1049912914 035 $a(transcript Verlag)9783839406816 035 $a(MiAaPQ)EBC6955721 035 $a(Au-PeEL)EBL6955721 035 $a(oapen)https://directory.doabooks.org/handle/20.500.12854/33217 035 $a(ScCtBLL)2318c092-65e4-4bbc-b9a7-58bb21c839a0 035 $a(oapen)doab33217 035 $a(EXLCZ)993710000000482714 100 $a20260202h20152007 uy 0 101 0 $aeng 135 $auuuuu---auuuu 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 14$aThe Politics of Imagination$eBenjamin, Kracauer, Kluge$fTara Forrest 205 $a1st ed. 210 $aBielefeld$ctranscript Verlag$d2015 210 $d2015, c2007 215 $a1 online resource (198) 225 0 $aKultur- und Medientheorie 311 08$a9783899426816 311 08$a3899426819 320 $aIncludes bibliographical references. 327 $aFrontmatter 1 Contents 5 Introduction 9 Chapter 1: Benjamin, Proust and the Rejuvenating Powers of Memory 21 Chapter 2: The Politics of Aura and Imagination in Benjamin's Writings on Hashish 43 Chapter 3: "Reproducibility - Distraction - Politicization" 65 Chapter 4: "Film as the Discoverer of the Marvels of Everyday Life": Kracauer and the Promise of Realist Cinema 89 Chapter 5: On the Task of a Realist Historiography in Kracauer's History: The Last Things Before the Last 107 Chapter 6: From History's Rubble: Kluge on Film, History, and Politics 127 Chapter 7: Raw Materials for the Imagination: Kluge's Work for Television 149 Conclusion 169 Bibliography 175 Other Works Cited 191 Acknowledgements 193 330 $aThis book explores Walter Benjamin, Siegfried Kracauer and Alexander Kluge's analyses of the role that a rejuvenation in the capacity for imagination can play in encouraging us to reconceive the possibilities of the past, the present, and the future outside of the parameters of the status quo. The concept of imagination to which the title of the book refers is not a strictly defined, stable concept, but rather a term which is employed to refer to a capacity that facilitates both an active, creative relationship to one's environment, and a process of mediation between the outside world and one's own experiences and memories.Through a detailed analysis of their engagements with subjects that span a broad range of historical and thematic contexts (including topics as diverse as literature, children's play, film, photography, history, and television) the book charts the extent to which the concept of imagination plays a central role in Benjamin, Kracauer, and Kluge's explorations of a mode of perception and experience which could serve as a catalyst for the creation and sustenance of a desire for a different kind of future. 330 1 $a»Beyond its immediate appeal to those interested in film and cultural theory will [this book] contribute well to the increasing interest in emergent studies, the interactions between literature, art, science and science philosophy.« 330 1 $aReviewed in:cultural studies review, 14/2, 9 (2008), Lisa McDonaldfsk Hamburg, 09.08.2009, Olaf Berg 330 1 $a»Während die Verbindung von Benjamin und Kluge geläufig ist, so wird Kracauers spätes Werk zur Film- und Geschichtstheorie recht selten überhaupt wahrgenommen. 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Tara Forrest, University of Technology, Sydney

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