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100   $a20140226h20142014  uy|            0
101 0 $aeng
135   $aur|nu---|u||u
181   $ctxt
182   $cc
183   $acr
200 00$aPolymer surface characterization /$fedited by Luigia Sabbatini
210  1$aBerlin ;$aBoston :$cDe Gruyter,$d[2014]
210  4$d©2014
215   $a1 online resource (308 p.)
225 1 $aDe Gruyter graduate
300   $aDescription based upon print version of record.
311   $a3-11-027508-2 
320   $aIncludes bibliographical references and index.
327   $tFront matter --$tPreface --$tContents --$tContributing authors --$t1. Introductory remarks on polymers and polymer surfaces /$rCometa, Stefania / Sabbatini, Luigia --$t2. Investigation of polymer surfaces by time-of-flight secondary ion mass spectrometry /$rKeller, Beat A. --$t3. Polymer surface chemistry: Characterization by XPS /$rGiglio, Elvira De / Ditaranto, Nicoletta / Sabbatini, Luigia --$t4. Attenuated total reflection-Fourier transform infrared spectroscopy: A powerful tool for investigating polymer surfaces and interfaces /$rMangolini, Filippo / Rossi, Antonella --$t5. Scanning probe microscopy of polymers /$rYablon, Dalia --$t6. Polymer surface morphology: Characterization by electron microscopies /$r?louf, Miroslav / Vacková, Tatana / Lednický, Franti?ek / Wandrol, Petr --$t7. Wettability: Significance and measurement /$rPalumbo, Fabio / Mundo, Rosa Di --$t8. Advances of spectroscopic ellipsometry in the analysis of thin polymer films-polymer interfaces /$rBittrich, Eva / Eichhorn, Klaus-Jochen --$tIndex
330   $aPolymer Surface Characterization provides a comprehensive approach to the surface analysis of polymers of technological interest by means of modern analytical techniques. Basic principles, operative conditions, applications, performance, and limiting features are supplied, together with current advances in instrumental apparatus. Each chapter is devoted to one technique and is self-consistent; the end-of-chapter references would allow the reader a quick access to more detailed information. After an introductory chapter, techniques that can interrogate the very shallow depth of a polymer surface, spanning from the top few angstroms in secondary ions mass spectrometry to 2-10 nm in X-ray photoelectron spectroscopy are discussed, followed by Fourier transform infrared spectroscopy and chapters on characterization by scanning probe microscopy, electron microscopies, wettability and spectroscopic ellipsometry.
410  0$aDe Gruyter graduate.
606   $aPolymers$xSurfaces$xAnalysis
615  0$aPolymers$xSurfaces$xAnalysis.
676   $a547/.70453
686   $aVE 8000$2rvk
702   $aSabbatini$b Luigia
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910821150003321
996   $aPolymer surface characterization$94018892
997   $aUNINA