LEADER 06663nam 22006855 450 001 9910820311303321 005 20240516014422.0 010 $a3-642-80233-8 024 7 $a10.1007/978-3-642-80233-1 035 $a(CKB)3400000000108507 035 $a(SSID)ssj0000806026 035 $a(PQKBManifestationID)12365405 035 $a(PQKBTitleCode)TC0000806026 035 $a(PQKBWorkID)10747963 035 $a(PQKB)11291956 035 $a(DE-He213)978-3-642-80233-1 035 $a(MiAaPQ)EBC3096364 035 $a(EXLCZ)993400000000108507 100 $a20121227d1996 u| 0 101 0 $aeng 135 $aurnn|008mamaa 181 $ctxt 182 $cc 183 $acr 200 10$aElectronic Distance Measurement $eAn Introduction /$fby Jean M. Rüeger 205 $a4th ed. 1996. 210 1$aBerlin, Heidelberg :$cSpringer Berlin Heidelberg :$cImprint: Springer,$d1996. 215 $a1 online resource (XIX, 276 p.) 300 $a"With 56 Figures and 18 Tables." 311 $a3-540-61159-2 320 $aIncludes bibliographical references and index. 327 $a1 History -- 2 Physical Laws and Units Related to EDM -- 2.1 Definitions -- 2.2 Frequency Spectrum -- 2.3 Velocity of Light in a Vacuum -- 2.4 Units and Their Definitions -- 3 Principles and Applications of EDM -- 3.1 Pulse Method -- 3.2 Phase Difference Method -- 3.3 Doppler Methods -- 3.4 Interferometry -- 4 Basic Working Principles of Electronic Distance Meters -- 4.1 Electro-Optical Instruments -- 4.2 Microwave Instruments -- 5 Propagation of Electromagnetic Waves Through the Atmosphere -- 5.1 Atmospheric Transmittance -- 5.2 Range of EDM Instruments -- 5.3 Phase Refractive Index -- 5.4 Group Refractive Index of Light and NIR Waves for Standard Conditions -- 5.5 Group Refractive Index of Light and NIR Waves at Ambient Conditions -- 5.6 Refractive Index of Microwaves -- 5.7 Coefficient of Refraction -- 5.8 Measurement of Atmospheric Parameters -- 5.9 Determination of the Refractive Index -- 6 Velocity Corrections to Measured Distances -- 6.1 Reference Refractive Index -- 6.2 First Velocity Correction -- 6.3 Real-Time Application of First Velocity Correction by EDM Instrument -- 6.4 Second Velocity Correction -- 6.5 Refined Method of Reduction of Measured Distance to Wave Path Chord -- 7 Geometrical Corrections -- 7.1 Reduction to the Spheroid Using Station Heights -- 7.2 Reduction to the Spheroid, Using Measured Zenith Angles -- 8 Miscellaneous Corrections, Computations and Numerical Examples -- 8.1 Correction of Measured Distance to Zenith Angle Ray Path -- 8.2 Eye-to-Object Corrections for Zenith Angles and Distances -- 8.3 Height Difference from Measured Zenith Angle(s) and Slope Distance -- 8.4 Determination of the Coefficient of Refraction from Reciprocal Zenith Angle Measurements -- 8.5 Reduction to Centre of Distances -- 8.6 Numerical Examples -- 9 Electro-Optical Distance Meters -- 9.1 Classification of Electro-Optical Distance Meters -- 9.2 Design of Some Electro-Optical Distance Meters -- 10 Reflectors -- 10.1 Introduction -- 10.2 Glass Prism Reflectors -- 11 Batteries and Other Power Sources -- 11.1 Review of Power Sources -- 11.2 Batteries Used in EDM -- 11.3 Sealed Nickel-Cadmium Batteries -- 12 Errors of Electro-Optical Distance Meters -- 12.1 Additive Constant -- 12.2 Short Periodic Errors -- 12.3 Scale Errors -- 12.4 Non-Linear Distance-Dependent Errors -- 12.5 Summary and Mathematical Model of Errors -- 13 Calibration of Electro-Optical Distance Meters -- 13.1 Introduction -- 13.2 Calibration on EDM Baselines -- 13.3 Calibration on Cyclic Error Testlines -- 13.4 Calibration of Modulation Frequency -- 13.5 Accuracy Specifications of EDM Instruments -- Appendices -- A. First Velocity Correction for Precise Electro-Optical Distance Measurement -- B. Tables of Saturation Water Vapour Pressures -- C. Parameters of the ICAO Standard Atmosphere -- D. Data of a Selection of Electro-Optical Distance Meters as Required for the Derivation of the First Velocity Correction and for Calibration Purposes -- E. Technical Data of a Selection of Short Range Distance Meters -- F. Technical Data of a Selection of Pulse Distance Meters -- G. Technical Data of a Selection of Long Range Distance Meters -- H. Critical Dimensions of a Selection of Reflectors -- References. 330 $aElectronic Distance Measurement This text gives an up-to-date introduction into electronic distance measurement (EDM) with a comprehensive review of modern equipment and procedures. It is excellently suited as a text for undergraduate and graduate students and an invaluable reference for practicing surveyors, geodesists and other scientists using EDM as a measuring tool. This fourth edition of a text first published in Sydney in 1978 is based on Rüeger's teaching experience at the University of New South Wales in Sydney, Australia. Introductory chapters provide an overview of relevant laws of physics and basic principles of different types of EDM instruments. The following chapters examine velocity corrections, derive geometrical reductions from first principles and explain the design of state-of-the-art electro-optical distance meters. The final chapters introduce reflectors, power sources and instrument errors, and conclude with measurement and analysis procedures for the calibration of distance meters. 606 $aGeophysics 606 $aGeographical information systems 606 $aSolid state physics 606 $aSpectroscopy 606 $aMicroscopy 606 $aGeophysics/Geodesy$3https://scigraph.springernature.com/ontologies/product-market-codes/G18009 606 $aGeographical Information Systems/Cartography$3https://scigraph.springernature.com/ontologies/product-market-codes/J13000 606 $aSolid State Physics$3https://scigraph.springernature.com/ontologies/product-market-codes/P25013 606 $aSpectroscopy and Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/P31090 615 0$aGeophysics. 615 0$aGeographical information systems. 615 0$aSolid state physics. 615 0$aSpectroscopy. 615 0$aMicroscopy. 615 14$aGeophysics/Geodesy. 615 24$aGeographical Information Systems/Cartography. 615 24$aSolid State Physics. 615 24$aSpectroscopy and Microscopy. 676 $a526/.028 700 $aRüeger$b Jean M$4aut$4http://id.loc.gov/vocabulary/relators/aut$0632504 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910820311303321 996 $aElectronic distance measurement$933328 997 $aUNINA