LEADER 04362nam 2200625 450 001 9910819229003321 005 20230721034500.0 010 $a3-03813-146-6 035 $a(CKB)3710000000025449 035 $a(EBL)1869133 035 $a(SSID)ssj0001127794 035 $a(PQKBManifestationID)11634203 035 $a(PQKBTitleCode)TC0001127794 035 $a(PQKBWorkID)11152109 035 $a(PQKB)11220650 035 $a(Au-PeEL)EBL1869133 035 $a(CaPaEBR)ebr10777684 035 $a(OCoLC)868960584 035 $a(MiAaPQ)EBC1869133 035 $a(EXLCZ)993710000000025449 100 $a20070415d2007 fy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aDiffusion and stresses $eproceedings of the International Workshop on Diffusion and Stresses, Lillafu?red, Hungary, September 19-22, 2006 /$fedited by D. L. Beke, Z. Erde?lyi and I. A. Szabo? 210 1$aSwitzerland :$cTrans Tech Publications Ltd,$d2007. 210 4$dİ2007 215 $a1 online resource (181 p.) 225 1 $aDefect and Diffusion Forum,$x1662-9507 ;$vVol. 264 300 $aDescription based upon print version of record. 311 $a3-908451-41-8 320 $aIncludes bibliographical references and index. 327 $aDiffusion and Stresses; Participants; Committees; Preface; Table of Contents; Stress and Intermixing in Epitaxial Ni(111)/Mo(110) Superlattices; Redistribution of Implanted Species in Polycrystalline Silicon Films on Silicon Substrate ; Investigating Interdiffusion in Mo/V Multilayers from X-Ray Scattering and Kinetic Simulations ; Intermixing in Cu/Co: Molecular Dynamics Simulations and Auger Electron Spectroscopy Depth Profiling ; Simultaneous Measurement of Tracer Jump Frequencies on Different Sublattices in Ga7Pd3 Using PAC ; Dopant Diffusion during Amorphous Silicon Crystallization 327 $aGrain Boundary Surface Tension, Segregation and Diffusion in Cu-Sn System The Stress Field in Cu-Fe-Ni Diffusion Couples; Effect of Morphology on the Mobility of Nanosized Liquid Pb Inclusions in Solid Al ; Nonlinear Field Theory of the Stress Induced Interdiffusion and Mass Transport ; Stress Evolution in Thin Films; Diffusion and Reactions; Cross Diffusion-Stresses Effects; Nanoscale Effects in Interdiffusion; Diffusion-Induced Stresses: Theory and Applications; Nonequilibrium Vacancies in Nanosystems ; Nonlinear Stress Effects in Diffusion 327 $aStress Relaxation Mechanisms during Cd21Ni5 Intermetallic Growth under High Hydrostatic Pressure Thermal and Mechanical Stability of Polycrystalline Nanowires; On the Role of Stress, Strain and Diffusion in Dissolution - Condensation Mechanism of Liquid Metal Embrittlement ; Diffusion of Implanted Metals in Tantalum Silicide; Solid-State Reactions in Ni(10 nm)/C(2 nm)/Si(001) Thin Film System ; Influence of Annealing Environment and Film Thickness on the Phase Formation in the Ti/Si(100) and (Ti +Si)/Si(100) Thin Film Systems ; Study of Diffusion and Reaction Diffusion in the Fe-C-Nb System 327 $aOn the Local Equilibrium during Dissolution of a Thin FilmKeywords Index; Authors Index 330 $aThe question of the interrelationship between diffusion and stress is almost as old as the investigation of diffusion itself. Nowadays, the study of various diffusion and solid-state reaction processes in thin films and multilayers is a vital area of research activity in which, inevitably, diffusion-induced or thermal stresses are of primary importance. This timely book covers all aspects of the interrelationship between stresses and diffusion phenomena occurring in bulk solids, thin films and multilayered materials and also those which take place at surfaces and interfaces. Such stress-effect 410 0$aDiffusion and defect data.$nPt. A,$pDefect and diffusion forum ;$v264. 606 $aDiffusion$vCongresses 606 $aPhysics$vCongresses 615 0$aDiffusion 615 0$aPhysics 676 $a620 701 $aBeke$b D. L$g(Dezso? L.)$0931687 701 $aErde?lyi$b Z$g(Zolta?n)$01630087 701 $aSzabo?$b I. A$01630088 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910819229003321 996 $aDiffusion and stresses$93968166 997 $aUNINA