LEADER 00910nam0-22003251i-450- 001 990000135110403321 005 20070702160021.0 035 $a000013511 035 $aFED01000013511 035 $a(Aleph)000013511FED01 035 $a000013511 100 $a20020821d1996----km-y0itay50------ba 101 0 $aita 105 $ay-------001yy 200 1 $aGPS$eguida introduttiva all'uso del GPS in geodesia e topografia$fNikon instruments, Trimble navigation 210 $aFirenze$cs.e.$d1996 215 $a152 p.$cill.$d21 cm 225 1 $aManuali Nikon 610 0 $aGeodesia 610 0 $aRilievi topografici 676 $a526.6 710 02$aNikon instruments$c$0333700 712 02$aTrimble$c 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990000135110403321 952 $a13 D 11 15$b9984$fFINBC 959 $aFINBC 996 $aGPS$9113287 997 $aUNINA LEADER 03487nam 2200637 450 001 9910817869403321 005 20230803071611.0 010 $a1-118-91677-8 010 $a1-118-91678-6 010 $a1-118-91676-X 035 $a(CKB)3710000000224488 035 $a(EBL)1770689 035 $a(OCoLC)879329842 035 $a(SSID)ssj0001292790 035 $a(PQKBManifestationID)11765813 035 $a(PQKBTitleCode)TC0001292790 035 $a(PQKBWorkID)11284987 035 $a(PQKB)11734331 035 $a(MiAaPQ)EBC4039825 035 $a(OCoLC)891400216 035 $a(MiAaPQ)EBC1770689 035 $a(DLC) 2014017866 035 $a(Au-PeEL)EBL1770689 035 $a(CaPaEBR)ebr10913519 035 $a(PPN)188123830 035 $a(EXLCZ)993710000000224488 100 $a20140829h20142014 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aSecondary ion mass spectrometry $ean introduction to principles and practices /$fPaul van der Heide 210 1$aHoboken, New Jersey :$cWiley,$d2014. 210 4$d©2014 215 $a1 online resource (365 p.) 225 1 $aTHEi Wiley ebooks 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a1-118-48048-1 311 $a1-322-07843-2 320 $aIncludes bibliographical references and index. 327 $aMachine generated contents note: Forward x Preface xi Acknowledgements xiv List of physical constants xiv Chapter 1: Introduction 1.1 Matter and the Mass Spectrometer 1.2 Secondary Ion Mass Spectrometry 1.3 Summary Section I Chapter 2: Properties of atoms, ions, molecules and solids 2.1 The Atom 2.2 Electronic structure of atoms and ions 2.3 Summary Chapter 3: Current understanding of sputtering and ion formation 3.1 The fundamentals of SIMS 3.2 Sputtering 3.3 Ionization/neutralization 3.4 Summary Section II Chapter 4: Instrumentation 4.1 The science of measurement 4.2 Hardware 4.3 Summary Chapter 5: Data collection 5.1 The art of measurement 5.2 Sample preparation and handling 5.3 Data collection 5.4 Data conversion 5.5 Summary Appendix i) Periodic table of the elements ii) Isotope masses, natural isotope abundances, atomic weights and mass densities of the elements iii) 1st and 2nd Ionization potentials and electron affinities of the elements iv) Work-functions of elemental solids v) SIMS detection limits of selected elements vi) Charged particle beam transport vii) Statistical properties viii) SIMS instrument designs ix) Additional SIMS methods of interest x) Additional spectrometric/spectroscopic techniques xi) Additional microscopic techniques xii) Diffraction / reflection techniques Technique acronym list Abbreviations commonly used in SIMS Glossary of terms Questions and answers References Index Notes. 330 $a"This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications"--$cProvided by publisher. 410 0$aTHEi Wiley ebooks. 606 $aSecondary ion mass spectrometry 615 0$aSecondary ion mass spectrometry. 676 $a543/.65 686 $aSCI013010$2bisacsh 700 $aVan der Heide$b Paul$f1962-$0900477 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910817869403321 996 $aSecondary ion mass spectrometry$94085044 997 $aUNINA