LEADER 05507nam 2200733Ia 450 001 9910814242903321 005 20240516151610.0 010 $a9781283646024 010 $a1283646021 010 $a9781118360699 010 $a1118360699 010 $a9781118360682 010 $a1118360680 010 $a9781118360668 010 $a1118360664 035 $a(CKB)3190000000032942 035 $a(EBL)894402 035 $a(OCoLC)812067151 035 $a(SSID)ssj0000717587 035 $a(PQKBManifestationID)11956149 035 $a(PQKBTitleCode)TC0000717587 035 $a(PQKBWorkID)10739974 035 $a(PQKB)11312083 035 $a(MiAaPQ)EBC894402 035 $a(WaSeSS)Ind00046274 035 $a(Au-PeEL)EBL894402 035 $a(CaPaEBR)ebr10606048 035 $a(CaONFJC)MIL395852 035 $a(Perlego)1001009 035 $a(EXLCZ)993190000000032942 100 $a20120302d2012 uy 0 101 0 $aeng 135 $aurnn|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aAtomic force microscopy $eunderstanding basic modes and advanced applications /$fGreg Haugstad 205 $a1st ed. 210 $aHoboken, N.J. $cJohn Wiley & Sons$dc2012 215 $a1 online resource (488 p.) 300 $aDescription based upon print version of record 311 1 $a9780470638828 311 1 $a0470638826 320 $aIncludes bibliographical references and index 327 $aAtomic Force Microscopy: Understanding Basic Modes and Advanced Applications; Contents; Preface; Acknowledgments; 1. Overview of AFM; 1.1. The Essence of the Technique; 1.2. Property Sensitive Imaging: Vertical Touching and Sliding Friction; 1.3. Modifying a Surface with a Tip; 1.4. Dynamic (or "AC" or "Tapping") Modes: Delicate Imaging with Property Sensitivity; 1.5. Force Curves Plus Mapping in Liquid; 1.6. Rate, Temperature, and Humidity-Dependent Characterization; 1.7. Long-Range Force Imaging Modes; 1.8. Pedagogy of Chapters; References; 2. Distance-Dependent Interactions 327 $a2.1. General Analogies and Types of Forces2.2. Van der Waals and Electrostatic Forces in a Tip-Sample System; 2.2.1. Dipole-Dipole Forces; 2.2.2. Electrostatic Forces; 2.3. Contact Forces and Mechanical Compliance; 2.4. Dynamic Probing of Distance-Dependent Forces; 2.4.1. Importance of Force Gradient; 2.4.2. Damped, Driven Oscillator: Concepts and Mathematics; 2.4.3. Effect of Tip-Sample Interaction on Oscillator; 2.4.4. Energy Dissipation in Tip-Sample Interaction; 2.5. Other Distance-Dependent Attraction and Repulsion: Electrostatic and Molecular Forces in Air and Liquids 327 $a2.5.1. Electrostatic Forces in Liquids: Superimposed on Van der Waals Forces2.5.2. Molecular-Structure Forces in Liquids; 2.5.3. Macromolecular Steric Forces in Liquids; 2.5.4. Derjaguin Approximation: Colloid Probe AFM; 2.5.5. Macromolecular Extension Forces (Air and Liquid Media); 2.6. Rate/Time Effects; 2.6.1. Viscoelasticity; 2.6.2. Stress-Modified Thermal Activation; 2.6.3. Relevance to Other Topics of Chapter 2; References; 3. Z-Dependent Force Measurements with AFM; 3.1. Revisit Ideal Concept; 3.2. Force-Z Measurement Components: Tip/Cantilever/Laser/Photodetector/Z Scanner 327 $a3.2.1. Basic Concepts and Interrelationships3.2.2. Tip-Sample Distance; 3.2.3. Finer Quantitative Issues in Force-Distance Measurements; 3.3. Physical Hysteresis; 3.4. Optical Artifacts; 3.5. Z Scanner/Sensor Hardware: Nonidealities; 3.6. Additional Force-Curve Analysis Examples; 3.6.1. Glassy Polymer, Rigid Cantilever; 3.6.2. Gels, Soft Cantilever; 3.6.3. Molecular-Chain Bridging Adhesion; 3.6.4. Bias-Dependent Electrostatic Forces in Air; 3.6.5. Screened Electrostatic Forces in Aqueous Medium; 3.7. Cantilever Spring Constant Calibration; References; 4. Topographic Imaging 327 $a4.1. Idealized Concepts4.2. The Real World; 4.2.1. The Basics: Block Descriptions of AFM Hardware; 4.2.2. The Nature of the Collected Data; 4.2.3. Choosing Setpoint: Effects on Tip-Sample Interaction and Thereby on Images; 4.2.4. Finite Response of Feedback Control System; 4.2.5. Realities of Piezoscanners: Use of Closed-Loop Scanning; 4.2.6. Shape of Tip and Surface; 4.2.7. Other Realities and Operational Difficulties-Variable Background, Drift, Experimental Geometry; References; 5. Probing Material Properties I: Phase Imaging 327 $a5.1. Phase Measurement as a Diagnostic of Interaction Regime and Bistability 330 $aThis book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions. "Supplementary material for this book can be found by entering ISBN 9780470638828 on booksuppo 606 $aAtomic force microscopy 606 $aScanning proble microscopy 615 0$aAtomic force microscopy. 615 0$aScanning proble microscopy 676 $a620/.5 700 $aHaugstad$b Greg$f1963-$01724645 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910814242903321 996 $aAtomic force microscopy$94126901 997 $aUNINA