LEADER 01112nam0 22002531i 450 001 UON00033943 005 20231205102113.879 100 $a20020107d1865 |0itac50 ba 101 $ager$aTUO 102 $aDE 105 $a|||| 1|||| 200 1 $aAusfuhrliches Lehrbuch der turkischen Sprache$fvon Jacob Goldenthal 210 $aWien$cDruck der Kaiserlich-Koniglichen Hof und Staatsdruckerei$d1865 iv,220 p. ; 21 cm 606 $aLINGUA TURCA OTTOMANA$xGRAMMATICHE STORICHE$3UONC010580$2FI 620 $aAT$dWien$3UONL003140 686 $aOTT II B$cIMPERO OTTOMANO - LINGUISTICA - GRAMMATICHE$2A 700 1$aGoldenthal$bJacob$3UONV022060$0645954 712 $aKaiserlich-Königlichen Hof- und Staatsdruckerei$3UONV251545$4650 801 $aIT$bSOL$c20240220$gRICA 899 $aSIBA - SISTEMA BIBLIOTECARIO DI ATENEO$2UONSI 912 $aUON00033943 950 $aSIBA - SISTEMA BIBLIOTECARIO DI ATENEO$dSI OTT II B 019 $eSI MR 22087 7 019 996 $aAusfuhrliches Lehrbuch der turkischen Sprache$91191173 997 $aUNIOR LEADER 02510nam 2200589 450 001 9910813550303321 005 20230828211543.0 010 $a1-280-90533-6 010 $a9786610905331 010 $a0-19-153248-7 010 $a1-4356-2225-1 035 $a(CKB)1000000000482046 035 $a(EBL)716784 035 $a(OCoLC)318618293 035 $a(SSID)ssj0000087506 035 $a(PQKBManifestationID)11998671 035 $a(PQKBTitleCode)TC0000087506 035 $a(PQKBWorkID)10053024 035 $a(PQKB)11352313 035 $a(MiAaPQ)EBC716784 035 $a(Au-PeEL)EBL716784 035 $a(CaPaEBR)ebr11204213 035 $a(CaONFJC)MIL90533 035 $a(MiAaPQ)EBC7034801 035 $a(Au-PeEL)EBL7034801 035 $a(EXLCZ)991000000000482046 100 $a20181228d2006 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aIn contradiction $ea study of the transconsistent /$fby Graham Priest 205 $aExpanded edition. 210 1$aOxford :$cClarendon Press,$d2006. 215 $a1 online resource (351 p.) 300 $aDescription based upon print version of record. 311 $a0-19-926329-9 320 $aIncludes bibliographical references and index. 327 $aTable of Contents; Acknowledgements of First Edition; Preface of First Edition; Preface of Second Edition; INTRODUCTION; PART I: THE LOGICAL PARADOXES; PART II: DIALETHEIC LOGICAL THEORY; PART III: APPLICATIONS; CONCLUSION; PART IV: MATERIAL NEW TO THE SECOND EDITION; Bibliography; Index 330 $aIn Contradiction advocates and defends the view that there are true contradictions (dialetheism), a view that flies in the face of orthodoxy in Western philosophy since Aristotle. The book has been at the centre of the controversies surrounding dialetheism ever since its first publication in 1987. This second edition of the book substantially expands upon the original in various ways, and also contains the author's reflections on developments overthe last two decades. Further aspects of dialetheism are discussed in the companion volume, Doubt Truth to be a Liar, also published by Oxford Univer 606 $aContradiction 615 0$aContradiction. 676 $a165 700 $aPriest$b Graham$0475721 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910813550303321 996 $aIn contradiction$94044744 997 $aUNINA LEADER 05340nam 2200673 a 450 001 9911019580903321 005 20200520144314.0 010 $a1-280-84764-6 010 $a9786610847648 010 $a0-470-61240-1 010 $a0-470-39453-6 010 $a1-84704-571-5 035 $a(CKB)1000000000335560 035 $a(EBL)700732 035 $a(SSID)ssj0000275603 035 $a(PQKBManifestationID)11234736 035 $a(PQKBTitleCode)TC0000275603 035 $a(PQKBWorkID)10219674 035 $a(PQKB)11688796 035 $a(MiAaPQ)EBC700732 035 $a(MiAaPQ)EBC262013 035 $a(Au-PeEL)EBL262013 035 $a(PPN)156604035 035 $a(OCoLC)501313832 035 $a(EXLCZ)991000000000335560 100 $a20061120d2007 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aX-ray diffraction by polycrystalline materials /$fRene Guinebretiere 210 $aLondon ;$aNewport Beach, CA $cISTE$d2007 215 $a1 online resource (385 p.) 225 1 $aISTE ;$vv.97 300 $aDescription based upon print version of record. 311 $a1-905209-21-5 320 $aIncludes bibliographical references (p. [319]-347) and index. 327 $aX-ray Diffraction by Polycrystalline Materials; Table of Contents; Preface; Acknowledgements; An Historical Introduction: The Discovery of X-rays and the First Studies in X-ray Diffraction; Part 1. Basic Theoretical Elements, Instrumentation and Classical Interpretations of the Results; Chapter 1. Kinematic and Geometric Theories of X-ray Diffraction; 1.1. Scattering by an atom; 1.1.1. Scattering by a free electron; 1.1.1.1. Coherent scattering: the Thomson formula; 1.1.1.2. Incoherent scattering: Compton scattering [COM 23]; 1.1.2. Scattering by a bound electron 327 $a1.1.3. Scattering by a multi-electron atom1.2. Diffraction by an ideal crystal; 1.2.1. A few elements of crystallography; 1.2.1.1. Direct lattice; 1.2.1.2. Reciprocal lattice; 1.2.2. Kinematic theory of diffraction; 1.2.2.1. Diffracted amplitude: structure factor and form factor; 1.2.2.2. Diffracted intensity; 1.2.2.3. Laue conditions [FRI 12]; 1.2.3. Geometric theory of diffraction; 1.2.3.1. Laue conditions; 1.2.3.2. Bragg's law [BRA 13b, BRA 15]; 1.2.3.3. The Ewald sphere; 1.3. Diffraction by an ideally imperfect crystal; 1.4. Diffraction by a polycrystalline sample 327 $aChapter 2. Instrumentation used for X-ray Diffraction2.1. The different elements of a diffractometer; 2.1.1. X-ray sources; 2.1.1.1. Crookes tubes; 2.1.1.2. Coolidge tubes; 2.1.1.3. High intensity tubes; 2.1.1.4. Synchrotron radiation; 2.1.2. Filters and monochromator crystals; 2.1.2.1. Filters; 2.1.2.2. Monochromator crystals; 2.1.2.3. Multi-layered monochromators or mirrors; 2.1.3. Detectors; 2.1.3.1. Photographic film; 2.1.3.2. Gas detectors; 2.1.3.3. Solid detectors; 2.2. Diffractometers designed for the study of powdered or bulk polycrystalline samples 327 $a2.2.1. The Debye-Scherrer and Hull diffractometer2.2.1.1. The traditional Debye-Scherrer and Hull diffractometer; 2.2.1.2. The modern Debye-Scherrer and Hill diffractometer: use of position sensitive detectors; 2.2.2. Focusing diffractometers: Seeman and Bohlin diffractometers; 2.2.2.1. Principle; 2.2.2.2. The different configurations; 2.2.3. Bragg-Brentano diffractometers; 2.2.3.1. Principle; 2.2.3.2. Description of the diffractometer; path of the X-ray beams; 2.2.3.3. Depth and irradiated volume; 2.2.4. Parallel geometry diffractometers; 2.2.5. Diffractometers equipped with plane detectors 327 $a2.3. Diffractometers designed for the study of thin films2.3.1. Fundamental problem; 2.3.1.1. Introduction; 2.3.1.2. Penetration depth and diffracted intensity; 2.3.2. Conventional diffractometers designed for the study of polycrystalline films; 2.3.3. Systems designed for the study of textured layers; 2.3.4. High resolution diffractometers designed for the study of epitaxial films; 2.3.5. Sample holder; 2.4. An introduction to surface diffractometry; Chapter 3. Data Processing, Extracting Information; 3.1. Peak profile: instrumental aberrations; 3.1.1. X-ray source: g1(?); 3.1.2. Slit: g2(?) 327 $a3.1.3. Spectral width: g3(?) 330 $aThis book presents a physical approach to the diffraction phenomenon and its applications in materials science.An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural ana 410 0$aISTE 606 $aX-rays$xDiffraction 606 $aCrystallography 615 0$aX-rays$xDiffraction. 615 0$aCrystallography. 676 $a548/.83 700 $aGuinebretiere$b Rene$0960291 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9911019580903321 996 $aX-ray diffraction by polycrystalline materials$92176577 997 $aUNINA