LEADER 03489nam 2200709Ia 450 001 9910811546603321 005 20200520144314.0 010 $a1-107-14600-3 010 $a1-280-43766-9 010 $a9786610437665 010 $a0-511-18412-3 010 $a0-511-16565-X 010 $a0-511-16372-X 010 $a0-511-31266-0 010 $a0-511-75471-X 010 $a0-511-16452-1 035 $a(CKB)1000000000353551 035 $a(EBL)255181 035 $a(OCoLC)171138180 035 $a(SSID)ssj0000258553 035 $a(PQKBManifestationID)11192448 035 $a(PQKBTitleCode)TC0000258553 035 $a(PQKBWorkID)10272241 035 $a(PQKB)10455368 035 $a(UkCbUP)CR9780511754715 035 $a(Au-PeEL)EBL255181 035 $a(CaPaEBR)ebr10120453 035 $a(CaONFJC)MIL43766 035 $a(OCoLC)80244620 035 $a(MiAaPQ)EBC255181 035 $a(PPN)261362313 035 $a(EXLCZ)991000000000353551 100 $a20030226d2003 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aThin film materials $estress, defect formation, and surface evolution /$fL.B. Freund, S. Suresh 205 $a1st ed. 210 $aCambridge, UK ;$aNew York $cCambridge University Press$d2003 215 $a1 online resource (xviii, 750 pages) $cdigital, PDF file(s) 300 $aTitle from publisher's bibliographic system (viewed on 05 Oct 2015). 311 $a0-521-52977-8 311 $a0-521-82281-5 320 $aIncludes bibliographical references (p. 713-737) and index. 327 $aCover; Half-title; Title; Copyright; Dedication; Contents; Preface; 1 Introduction and Overview; 2 Film stress and substrate curvature; 3 Stress in anisotropic and patterned films; 4 Delamination and fracture; Film buckling, bulging and peeling; 6 Dislocation formation in epitaxial systems; 7 Dislocation interactions and strain relaxation; 8 Equilibrium and stability of surfaces; 9 The role of stress in mass transport; References; Author index; Subject index 330 $aThin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field. 606 $aThin films 606 $aSurfaces (Technology) 615 0$aThin films. 615 0$aSurfaces (Technology) 676 $a621.3815/2 700 $aFreund$b L. B$0595840 701 $aSuresh$b S$g(Subra)$0739211 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910811546603321 996 $aThin film materials$91464303 997 $aUNINA