LEADER 04305nam 2200697 450 001 9910809724203321 005 20231115115442.0 010 $a9781608079865 010 $a1-5231-4621-4 010 $a1-60807-986-4 035 $a(CKB)3710000001178060 035 $a(Au-PeEL)EBL4845579 035 $a(CaPaEBR)ebr11377515 035 $a(OCoLC)968267997 035 $a(CaBNVSL)mat09100918 035 $a(IEEE)9100918 035 $a(MiAaPQ)EBC4845579 035 $a(EXLCZ)993710000001178060 100 $a20200729d2016 uy 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $ccr$2rdamedia 183 $ac$2rdacarrier 200 13$aAn engineer's guide to automated testing of high-speed interfaces /$fJose? Moreira, Hubert Werkmann 205 $aSecond edition. 210 1$aNorwood, Massachusetts :$cArtech House,$d[2016] 210 4$dŠ2016 215 $a1 online resource (709 pages) $cillustrations 225 1 $aArtech House microwave library 311 1 $a9781608079858 311 1 $a1-60807-985-6 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $aPreface to the Second Edition; Preface to the First Edition; 1 Introduction; 1.1 Characterization and Design Verification; 1.2 Production Testing; 1.3 Accuracy and Correlation; 1.4 The ATE Test Fixture; 1.5 The Future; 2 High-Speed Digital Basics; 2.1 High-Speed Digital Signaling; 2.2 Time and Frequency-Domains; 2.3 Bit Error Rate; 2.4 Jitter; 2.5 Classification of High-Speed I/O Interfaces; 2.6 Hardware Building Blocks and Concepts; 2.7 Multilevel Signaling; 3 High-Speed Interface Standards; 3.1 PCI Express; 3.2 XDR DRAM; 3.3 GDDR SDRAM; 3.4 MIPI Standards. 327 $a3.5 Other High-Speed Digital Interface Standards4 ATE Instrumentation for DigitalApplications; 4.1 ATE Timing Architectures; 4.2 Digital Pin Electronics ATE Card; 4.3 Sampler/Digitizer ATE Card; 4.4 Parametric Measurements with Sampled Data; 4.5 Power Supplies; 5 Tests and Measurements; 5.1 Bit and Pattern Alignment; 5.2 Functional Test; 5. 330 $aThis second edition of An Engineer#x92;s Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing. 410 0$aArtech House microwave library. 517 3 $aGuide to automated testing of high-speed interfaces 517 3 $aAutomated testing of high-speed interfaces 606 $aEquip de test automātic$2lemac 606 $aCircuits integrats$xProves$2lemac 606 $aCircuits integrats d'alta velocitat$xProves$2lemac 606 $aIntegrated circuits$xTesting 606 $aAutomatic test equipment 606 $aVery high speed integrated circuits 615 7$aEquip de test automātic 615 7$aCircuits integrats$xProves 615 7$aCircuits integrats d'alta velocitat$xProves 615 0$aIntegrated circuits$xTesting. 615 0$aAutomatic test equipment. 615 0$aVery high speed integrated circuits. 676 $a621.3815 700 $aMoreira$b Jose?$f1975-$0771266 702 $aWerkmann$b Hubert 801 0$bCaBNVSL 801 1$bCaBNVSL 801 2$bCaBNVSL 906 $aBOOK 912 $a9910809724203321 996 $aAn engineer's guide to automated testing of high-speed interfaces$94065786 997 $aUNINA