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001 9910809480903321
005 20200520144314.0
010 0 $a9780191524691
010 0 $a0191524697
035   $a(MiAaPQ)EBC7034788
035   $a(CKB)24235070000041
035   $a(MiAaPQ)EBC430810
035   $a(Au-PeEL)EBL430810
035   $a(CaPaEBR)ebr10180288
035   $a(CaONFJC)MIL116038
035   $a(OCoLC)609831339
035   $a(EXLCZ)9924235070000041
100   $a20060327d2006      uy             0
101 0 $aeng
135   $aur|||||||||||
200 10$aExperimental techniques for low-temperature measurements$b[electronic resource] $ecryostat design, material properties, and superconductor critical-current testing /$fJack W. Ekin
210   $aOxford ;$aNew York $cOxford University Press$d2006
215   $axxviii, 673 p. $cill
320   $aIncludes bibliographical references and index.
606   $aLow temperatures$xMeasurement
606   $aLow temperatures$xInstruments
606   $aLow temperature research
606   $aSuperconductors
615  0$aLow temperatures$xMeasurement.
615  0$aLow temperatures$xInstruments.
615  0$aLow temperature research.
615  0$aSuperconductors.
676   $a536/.54
700   $aEkin$b J. W$01277753
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
912   $a9910809480903321
996   $aExperimental techniques for low-temperature measurements$93940042
997   $aUNINA