LEADER 05177nam 2200709 a 450 001 9910809297503321 005 20200520144314.0 010 $a1-118-49851-8 010 $a1-118-49848-8 010 $a1-299-18823-0 010 $a1-118-49850-X 035 $a(CKB)2670000000333519 035 $a(EBL)1120410 035 $a(SSID)ssj0000831570 035 $a(PQKBManifestationID)11530818 035 $a(PQKBTitleCode)TC0000831570 035 $a(PQKBWorkID)10880605 035 $a(PQKB)11101795 035 $a(Au-PeEL)EBL1120410 035 $a(CaPaEBR)ebr10657802 035 $a(CaONFJC)MIL450073 035 $a(CaSebORM)9781118498484 035 $a(MiAaPQ)EBC1120410 035 $a(OCoLC)825819485 035 $a(PPN)182855015 035 $a(OCoLC)868160730 035 $a(OCoLC)ocn868160730 035 $a(EXLCZ)992670000000333519 100 $a20121023d2013 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aLow voltage electron microscopy $eprinciples and applications /$fedited by David C. Bell and Natasha Erdman 205 $a1st edition 210 $aHoboken $cJohn Wiley & Sons Inc.$d2013 215 $a1 online resource (257 p.) 225 1 $aRoyal Microscopical Society-John Wiley series 300 $aDescription based upon print version of record. 311 $a1-119-97111-X 320 $aIncludes bibliographical references and index. 327 $aCover; Current and future titles in the Royal Microscopical Society- John Wiley Series; Title Page; Copyright; List of Contributors; Preface; Chapter 1: Introduction to the Theory and Advantages of Low Voltage Electron Microscopy; 1.1 Introduction; 1.2 Historical Perspective; 1.3 Beam Interaction with Specimen-Elastic and Inelastic Scattering; 1.4 Instrument Configuration; 1.5 Influence of Electron Optics Aberrations at Low Voltages; 1.6 SEM Imaging at Low Voltages; 1.7 TEM/STEM Imaging and Analysis at Low Voltages; 1.8 Conclusion; References 327 $aChapter 2: SEM Instrumentation Developments for Low kV Imaging and Microanalysis2.1 Introduction; 2.2 The Electron Source; 2.3 SEM Column Design Considerations; 2.4 Beam Deceleration; 2.5 Novel Detector Options and Energy Filters; 2.6 Low Voltage STEM in SEM; 2.7 Aberration Correction in SEM; 2.8 Conclusions; References; Chapter 3: Extreme High-Resolution (XHR) SEM Using a Beam Monochromator; 3.1 Introduction; 3.2 Limitations in Low Voltage SEM Performance; 3.3 Beam Monochromator Design and Implementation; 3.4 XHR Systems and Applications; 3.5 Conclusions; Acknowledgements; References 327 $aChapter 4: The Application of Low-Voltage SEM-From Nanotechnology to Biological Research4.1 Introduction; 4.2 Specimen Preparation Considerations; 4.3 Nanomaterials Applications; 4.4 Beam Sensitive Materials; 4.5 Semiconductor Materials; 4.6 Biological Specimens; 4.7 Low-Voltage Microanalysis; 4.8 Conclusions; References; Chapter 5: Low Voltage High-Resolution Transmission Electron Microscopy; 5.1 Introduction; 5.2 So How Low is Low?; 5.3 The Effect of Chromatic Aberration and Chromatic Aberration Correction; 5.4 The Electron Monochromator; 5.5 Theoretical Tradeoffs of Low kV Imaging 327 $a5.6 Our Experience at 40 keV LV-HREM5.7 Examples of LV-HREM Imaging; 5.8 Conclusions; References; Chapter 6: Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits; 6.1 Introduction; 6.2 Optimizing STEM Resolution and Probe Current at Low Primary Energies; 6.3 STEM Image Formation; 6.4 Gentle STEM Applications; 6.5 Discussion; 6.6 Conclusion; Acknowledgements; References; Chapter 7: Low Voltage Scanning Transmission Electron Microscopy of Oxide Interfaces; 7.1 Introduction; 7.2 Methods and Instrumentation; 7.3 Low Voltage Imaging and Spectroscopy; 7.4 Summary 327 $aAcknowledgementsReferences; Chapter 8: What's Next? The Future Directions in Low Voltage Electron Microscopy; 8.1 Introduction; 8.2 Unique Low Voltage SEM and TEM Instruments; 8.3 Cameras, Detectors, and Other Accessories; 8.4 Conclusions; References; Index 330 $a"Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before"--$cProvided by publisher. 410 0$aRMS-Wiley series. 606 $aElectron microscopy$xTechnique 615 0$aElectron microscopy$xTechnique. 676 $a502.8/25 686 $aSCI047000$2bisacsh 701 $aBell$b D. C$g(David C.)$01610551 701 $aErdman$b Natasha$01610552 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910809297503321 996 $aLow voltage electron microscopy$93938338 997 $aUNINA