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200 10$aUsing accelerated testing to predict module reliability$b[electronic resource] $epreprint /$fJohn H. Wohlgemuth and Sarah Kurtz
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300   $a"July 2011."
300   $a"Presented at the 37th IEEE Photovoltaic Specialists Conference (PVSC 37), Seattle, Washington, June 19-24, 2011."
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517   $aUsing Accelerated Testing To Predict Module Reliability 
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