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100   $a20200303d2019      uy             0
101 0 $aeng
135   $aurcnu||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aElectromagnetic nondestructive evaluation XXII /$fedited by Antonello Tamburrino, Yiming Deng, Sunil Chakrapani
210  1$aAmsterdam ;$aBerlin ;$aWashington, District of Columbia :$cIOS Press,$d[2019]
210  4$dİ2019
215   $a1 online resource (142 pages)
225 1 $aStudies in applied electromagnetics and mechanics ;$vVolume 44
300   $aIncludes index.
311   $a1-64368-040-4 
410  0$aStudies in applied electromagnetics and mechanics ;$vVolume 44.
606   $aElectromagnetic measurements$vCongresses
615  0$aElectromagnetic measurements
676   $a621.374
702   $aTamburrino$b Antonello
702   $aDeng$b Yiming
702   $aChakrapani$b Sunil
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910793836103321
996   $aElectromagnetic nondestructive evaluation XXII$93688575
997   $aUNINA