LEADER 05798nam 22007693u 450 001 9910791706103321 005 20210107012653.0 010 $a1-283-54976-X 010 $a9786613862211 010 $a1-118-39125-X 010 $a1-118-39124-1 010 $a1-118-39132-2 035 $a(CKB)2560000000090080 035 $a(EBL)995878 035 $a(OCoLC)821724682 035 $a(SSID)ssj0000715368 035 $a(PQKBManifestationID)11442921 035 $a(PQKBTitleCode)TC0000715368 035 $a(PQKBWorkID)10700914 035 $a(PQKB)10734085 035 $a(MiAaPQ)EBC995878 035 $a(PPN)164310843 035 $a(EXLCZ)992560000000090080 100 $a20131111d2012|||| u|| | 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aHandbook of Microwave Component Measurements$b[electronic resource] $ewith Advanced VNA Techniques 205 $a2nd ed. 210 $aHoboken $cWiley$d2012 215 $a1 online resource (637 p.) 300 $aDescription based upon print version of record. 311 $a1-119-97955-2 327 $aHANDBOOK OFMICROWAVE COMPONENTMEASUREMENTS; Contents; Foreword; Preface; Acknowledgments; List of Acronyms; 1 Introduction to Microwave Measurements; 1.1 Modern Measurement Process; 1.2 A Practical Measurement Focus; 1.3 Definition of Microwave Parameters; 1.3.1 S-Parameter Primer; 1.3.2 Phase Response of Networks; 1.4 Power Parameters; 1.4.1 Incident and Reflected Power; 1.4.2 Available Power; 1.4.3 Delivered Power; 1.4.4 Power Available from a Network; 1.4.5 Available Gain; 1.5 Noise Figure and Noise Parameters; 1.5.1 Noise Temperature; 1.5.2 Effective or Excess Input Noise Temperature 327 $a1.5.3 Excess Noise Power and Operating Temperature1.5.4 Noise Power Density; 1.5.5 Noise Parameters; 1.6 Distortion Parameters; 1.6.1 Harmonics; 1.6.2 Second-Order Intercept; 1.6.3 Two-Tone Intermodulation Distortion; 1.7 Characteristics of Microwave Components; 1.8 Passive Microwave Components; 1.8.1 Cables, Connectors and Transmission Lines; 1.8.2 Connectors; 1.8.3 Non-Coaxial Transmission Lines; 1.9 Filters; 1.10 Directional Couplers; 1.11 Circulators and Isolators; 1.12 Antennas; 1.13 PCB Components; 1.13.1 SMT Resistors; 1.13.2 SMT Capacitors; 1.13.3 SMT Inductors; 1.13.4 PCB Vias 327 $a1.14 Active Microwave Components1.14.1 Linear and Non-Linear; 1.14.2 Amplifiers: System, Low Noise, High Power; 1.14.3 Mixers and Frequency Converters; 1.14.4 Frequency Multipliers and Limiters and Dividers; 1.14.5 Oscillators; 1.15 Measurement Instrumentation; 1.15.1 Power Meters; 1.15.2 Signal Sources; 1.15.3 Spectrum Analyzers; 1.15.4 Vector Signal Analyzers; 1.15.5 Noise Figure Analyzers; 1.15.6 Network Analyzers; References; 2 VNA Measurement Systems; 2.1 Introduction; 2.2 VNA Block Diagrams; 2.2.1 VNA Source; 2.2.2 Understanding Source Match; 2.2.3 VNA Test Set 327 $a2.2.4 Directional Devices2.2.5 VNA Receivers; 2.2.6 IF and Data Processing; 2.2.7 Multiport Extensions; 2.2.8 High Power Test Systems; 2.3 VNA Measurement of Linear Microwave Parameters; 2.3.1 Linear Measurements Methods for S-Parameters; 2.3.2 Power Measurements with a VNA; 2.3.3 Other Measurement Limitations of the VNA; 2.3.4 Limitations Due to External Components; 2.4 Measurements Derived from S-Parameters; 2.4.1 The Smith Chart; 2.4.2 Transforming S-Parameters to Other Impedances; 2.4.3 Concatenating Circuits and T-Parameters; 2.5 Modeling Circuits Using Y and Z Conversion 327 $a2.5.1 Reflection Conversion2.5.2 Transmission Conversion; 2.6 Other Linear Parameters; 2.6.1 Z-Parameters, or Open-Circuit Impedance Parameters; 2.6.2 Y-Parameters, or Short-Circuit Admittance Parameters; 2.6.3 ABCD Parameters; 2.6.4 H-Parameters or Hybrid Parameters; 2.6.5 Complex Conversions and Non-Equal Reference Impedances; References; 3 Calibration and Vector Error Correction; 3.1 Introduction; 3.2 Basic Error Correction for S-Parameters: Cal Application; 3.2.1 Twelve-Term Error Model; 3.2.2 One-Port Error Model; 3.2.3 Eight-Term Error Model 327 $a3.3 Determining Error Terms: Cal Acquisition for 12-Term Models 330 $aThis book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure 606 $aMicrowave devices - Testing 606 $aMicrowave devices -- Testing 606 $aTECHNOLOGY & ENGINEERING / Microwaves 606 $aMicrowave devices$xTesting 606 $aElectrical & Computer Engineering$2HILCC 606 $aEngineering & Applied Sciences$2HILCC 606 $aElectrical Engineering$2HILCC 615 4$aMicrowave devices - Testing. 615 4$aMicrowave devices -- Testing. 615 4$aTECHNOLOGY & ENGINEERING / Microwaves. 615 0$aMicrowave devices$xTesting 615 7$aElectrical & Computer Engineering 615 7$aEngineering & Applied Sciences 615 7$aElectrical Engineering 676 $a537.5344 676 $a621.3813 686 $aTEC024000$2bisacsh 700 $aDunsmore$b Joel P$0865432 801 0$bAU-PeEL 801 1$bAU-PeEL 801 2$bAU-PeEL 906 $aBOOK 912 $a9910791706103321 996 $aHandbook of Microwave Component Measurements$91931539 997 $aUNINA