LEADER 00769nam0-22002891i-450- 001 990006614330403321 005 20001010 035 $a000661433 035 $aFED01000661433 035 $a(Aleph)000661433FED01 035 $a000661433 100 $a20001010d--------km-y0itay50------ba 101 0 $aita 105 $ay-------001yy 200 1 $aWelfare economics$fRobin Boadway , Neil Bruce 210 $aOxford$cB. Blackwell$d1984 215 $aVIII , 343 p. , 24 cm 700 1$aBoadway,$bRobin W.$f<1943- >$0126881 702 1$aBruce,$bNeil 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990006614330403321 952 $aVI A 577$b26412$fFSPBC 959 $aFSPBC 996 $aWelfare economics$9614695 997 $aUNINA DB $aGEN01 LEADER 02618nam 22005534a 450 001 9910791454203321 005 20230617011203.0 010 $a1-61503-093-X 035 $a(CKB)2560000000049842 035 $a(EBL)3002391 035 $a(OCoLC)729262390 035 $a(SSID)ssj0000485519 035 $a(PQKBManifestationID)11307144 035 $a(PQKBTitleCode)TC0000485519 035 $a(PQKBWorkID)10603902 035 $a(PQKB)10073509 035 $a(MiAaPQ)EBC3002391 035 $a(Au-PeEL)EBL3002391 035 $a(CaPaEBR)ebr10320384 035 $a(EXLCZ)992560000000049842 100 $a20050525d2005 uy 0 101 0 $aeng 135 $aurcn||||||||| 181 $ctxt 182 $cc 183 $acr 200 00$aLead-free solder interconnect reliability$b[electronic resource] /$fedited by Dongkai Shangguan 210 $aMaterials Park, OH $cASM International$d2005 215 $a1 online resource (302 p.) 300 $aDescription based upon print version of record. 311 $a0-87170-816-7 320 $aIncludes bibliographical references and index. 327 $a""Contents""; ""Foreword""; ""Preface""; ""Lead-Free Soldering and Environmental Compliance: An Overview""; ""Microstructural Evolution and Interfacial Interactions in Lead-Free Solder Interconnects""; ""Fatigue and Creep of Lead-Free Solder Alloys: Fundamental Properties""; ""Lead-Free Solder Joint Reliability Trends""; ""Chemical Interactions and Reliability Testing for Lead-Free Solder Interconnects""; ""Tin Whisker Growth on Lead-Free Solder Finishes""; ""Accelerated Testing Methodology for Lead-Free Solder Interconnects"" 327 $a""Thermomechanical Reliability Prediction of Lead-Free Solder Interconnects""""Design for Reliability Finite Element Modeling of Lead-Free Solder Interconnects""; ""Characterization and Failure Analyses of Lead-Free Solder Defects""; ""Reliability of Interconnects with Conductive Adhesives""; ""Lead-Free Solder Interconnect Reliability Outlook""; ""Index"" 606 $aMicroelectronic packaging$xReliability 606 $aSolder and soldering 606 $aLead-free electronics manufacturing processes 615 0$aMicroelectronic packaging$xReliability. 615 0$aSolder and soldering. 615 0$aLead-free electronics manufacturing processes. 676 $a621.381/046 701 $aShangguan$b Dongkai$f1963-$01533990 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910791454203321 996 $aLead-free solder interconnect reliability$93781155 997 $aUNINA